Instrumentation & Measurement Magazine 25-1 - 79

" gold standard " method and/or instrument aimed at measuring
jitter does not exist.
The difficulties arising from the comparisons of jitter measurements
provided by different instruments can be caused by
systematic differences in the measurement methods. For example,
the measurement of jitter with an ETO, being based on
multiple triggers, is sensitive to the trigger jitter. An RTO is instead
more sensitive to the sampling clock jitter. In the case of
BERT, jitter measurement performance depends mainly on the
sensitivity of its error detector [20].
Different setup factors can also influence the jitter measurement
results [7], for example the considered edge threshold or
reference level, the measurement interval as well as the measurement
duration. In addition, the system bandwidth, the
noise introduced by the measurement system, the probes and
cable lengths are important variables of concern, too [19]. For
example, the bandwidth of the analyzer must be large enough
to accurately represent the signal, but it has also to be narrow
enough to limit the out-of-band noise on the signal. It should
also be noted that narrow bandwidths filter higher frequency
harmonics, increasing as a consequence the rise/fall time of
the signal, worsening the effect of the analyzer noise [18].
By focusing on time domain instruments, other observations
can be drawn. In the case of the RTO, the voltage noise
floor is roughly proportional to the setting of its vertical sensitivity,
down to a minimum absolute noise floor [18]. BERT jitter
analysis is affected by the minimum voltage difference that the
comparator can discriminate. Clock jitter and trigger jitter are
important instrument-dependent parameters that can influence
the jitter measurement results.
The RTO sampling clock jitter includes both RJ and DJ components.
The RJ component depends on the clock reference
used for the measurement. Fixed frequency embedded-clock
reference measurements can be susceptible to the oscilloscope
time-base close-to-carrier phase noise, if the real time
waveform acquisitions become too long. Software phaselocked-loop
clock and explicit clock reference measurements
are not affected by the time-base close-to-carrier phase noise.
The sampling clock jitter of a good BERT is typically < 0.5 ps,
while it is not relevant to jitter analysis in the case of an ETO
[18].
Trigger jitter is dominated by RJ and sets the lower limit on
the RJ that can be observed. Trigger jitter does not affect jitter
analysis techniques used by an RTO, being the measurement
error of logic transition timing limited by the linearity of the

Instrumentation & Measurement Magazine 25-1

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