IEEE Instrumentation & Measurement - September 2023 - 31

Conclusion
This paper presented the resonant coaxial-line test method for
ESR and capacitance of ultra high-Q capacitors at high frequencies.
The analysis showed that for taking into account the skin
effect that affects the test fixture's resistance (rf
), the ASTM has
standardized a complex frequency extrapolation that hides a
theoretical error. For solving this issue, we proposed a direct frequency
extrapolation. An experimental result showed that the
ASTM procedure for computing the test fixture's resistance (rf
)
should be replaced by the proposed direct and simpler method
using (14). Requiring only a single operation this solution is not
affected by computation errors. Furthermore, knowing that a
typical ultra high-Q capacitor can now exhibit an ESR lower than
25 mΩ, this recommendation is particularly justified nowadays.
References
[1] " Boonton Model 34A Resonant Coaxial-Line Instruction
Manual. " [Online]. Available: http://w.ko4bb.com/getsimple/
index.php?id=download&file=06_Misc_Test_Equipment/
Boonton/Boonton_34A_Resonant_Coaxial_Line_Manual.pdf.
[2] Standard Test Method for Effective Series Resistance (ESR) and
Capacitance of Multilayer Ceramic Capacitors at High Frequencies,
American Society for Testing and Materials (ASTM), Standard
F752-82, 1982.
[3] W. C. Johnson, Transmission Lines and Networks. New York, New
York, USA: McGraw-Hill, 1951.
Francis Rodes (francis.rodes@gmail.com) has been an Assistant
Professor with the Bordeaux Institute of Technology
(ENSEIRB-MATMECA) Graduate School of Engineering in
Bordeaux, France since 1983. His research interests include
radio frequency circuit design and biomedical telemetry circuit
design. He received the Dipl.Eng. degree from ENSERB
in 1973 and the Ph.D. degree in electrical engineering from the
University of Bordeaux, France in 1981.
Xavier Hochart (xavier.hochart@exxelia.com) has been a Research
and Development Engineer with EXXELIA in Pessac,
France since 1997. His research interests include material
developments and Ultra HI-Q capacitor design, characterization
and measurement. He received the B.S. and M.S.
degrees in material sciences (Toulouse, France) in 1993 and
Specialized Master " Materials " from ENSCPB (Bordeaux,
France) in 1997.
[4] J. P. Maher, R. T. Jacobsen, and R. Lafferty, " High-frequency
measurement of Q-factor of ceramic chip capacitors, " IEEE Trans.
Components, Hybrids, and Manufacturing Technol., Sep. 1978.
[5] R. E. Debrecht, " Impedance measurement of microwave lumped
elements from 1 to 12 GHz, " IEEE Trans. Microw. Theory Tech., vol.
MTT-20, no. 1, Jan. 1972.
[6] " Products; capacitors, 459/sh-series, " Exxelia. [Online].
Available: https://exxelia.com/en/product/list/capacitors.
September 2023
IEEE Instrumentation & Measurement Magazine
31
https://exxelia.com/en/product/list/capacitors http://w.ko4bb.com/getsimple/index.php?id=download&file=06_Misc_Test_Equipment/Boonton/Boonton_34A_Resonant_Coaxial_Line_Manual.pdf http://w.ko4bb.com/getsimple/index.php?id=download&file=06_Misc_Test_Equipment/Boonton/Boonton_34A_Resonant_Coaxial_Line_Manual.pdf http://w.ko4bb.com/getsimple/index.php?id=download&file=06_Misc_Test_Equipment/Boonton/Boonton_34A_Resonant_Coaxial_Line_Manual.pdf

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