Evaluation Engineering - 14
HIGH-SPEED DIGITAL
Sponsored by
Anritsu Signal
Quality Analyzer-R
MP1900A Series
with PAM4 error
detector.
SPECIAL REPORT
TARGETING
NEXT-GENERATION
SIGNALS
Instrument makers address PAM4, PCIe 5, DDR5,
USB 4, 800 GbE signals and more
By Rick Nelson, Interim Chief Editor
High-speed digital test presents a
variety of challenges that can be addressed by instruments ranging from
oscilloscopes to bit-error-rate testers.
Challenges relate to PAM4 signal measurement, DDR5 probing, USB 4.0 transmitter test, PCIe Gen5 transmitter and
14
EVALUATION ENGINEERING JANUARY 2020
receiver tests, forward error correction,
phase-noise analysis, and time-domain
reflectometry (TDR).
For example, Anritsu Co. recently introduced a PAM4 error detector (ED) supporting 116-Gb/s bit error rate tests for
its Signal Quality Analyzer-R MP1900A
Series. "With the new module installed,
the MP1900A is the only instrument to
achieve error-free measurement of PAM4
signals at 116 Gb/s with industry-bestoperation bit rates and high Rx sensitivity
performance," said Hiroshi Goto, business development manager at Anritsu.
"Combined with the previously released
MP1900A Series PAM4 pattern generator
that supports high-accuracy BER measurements of PAM4 signals, the BERT
allows engineers to accurately evaluate
bit error rates of 400 GbE/800 GbE communications equipment and devices."
The MP1900A will be on exhibit at
DesignCon 2020 in January in Santa Clara.
"It is a bit-error-rate tester for communications speeds of 400G and faster, supporting
high-speed signal generation and signal
performance analysis," Goto said. "We will
highlight the built-in high-bandwidth and
high-input-sensitivity Rx circuit and the
new PAM4 ED MU196040B module that
supports error-free measurement of 100Gb/s PAM4 input signals even at a low
input amplitude of just 36 mV (typical)."
http://www.rsleads.com/001ee-900
http://www.rsleads.com/001ee-191
Evaluation Engineering
Table of Contents for the Digital Edition of Evaluation Engineering
Editorial: Machine learning boosts electrolyte search
By the Numbers
Industry Report
Vector Network Analyzers: From on-wafer test to breast-cancer detection
High-Speed Digital: Mentor targets hierarchical DFT and automotive safety
Compliance: Conformance and cooperation move 5G forward
Design Automation: EMA Design Automation's Marcano looks to the future of PCB EDA
Tech Focus
Featured Tech
Robotics: Robotics forge their way into the 21st century
Evaluation Engineering - Cover1
Evaluation Engineering - Cover2
Evaluation Engineering - 1
Evaluation Engineering - By the Numbers
Evaluation Engineering - 3
Evaluation Engineering - Industry Report
Evaluation Engineering - 5
Evaluation Engineering - Vector Network Analyzers: From on-wafer test to breast-cancer detection
Evaluation Engineering - 7
Evaluation Engineering - 8
Evaluation Engineering - 9
Evaluation Engineering - 10
Evaluation Engineering - 11
Evaluation Engineering - 12
Evaluation Engineering - 13
Evaluation Engineering - 14
Evaluation Engineering - 15
Evaluation Engineering - 16
Evaluation Engineering - 17
Evaluation Engineering - 18
Evaluation Engineering - High-Speed Digital: Mentor targets hierarchical DFT and automotive safety
Evaluation Engineering - 20
Evaluation Engineering - Compliance: Conformance and cooperation move 5G forward
Evaluation Engineering - 22
Evaluation Engineering - 23
Evaluation Engineering - Design Automation: EMA Design Automation's Marcano looks to the future of PCB EDA
Evaluation Engineering - 25
Evaluation Engineering - Tech Focus
Evaluation Engineering - 27
Evaluation Engineering - Featured Tech
Evaluation Engineering - 29
Evaluation Engineering - 30
Evaluation Engineering - 31
Evaluation Engineering - Robotics: Robotics forge their way into the 21st century
Evaluation Engineering - Cover3
Evaluation Engineering - Cover4
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