Evaluation Engineering - 14

INSTRUMENTATION

Now on the market
Here's what semiconductor test solution
vendors told us they've recently made
available and what their key features are.
Knoth, Cadence: "The Cadence Modus
DFT Software Solution enables designers to reduce SoC design time by up to
3X. It incorporates a patented 2D elastic
compression architecture, offering compression ratios beyond 400X without
impacting design size or routing. With a
complete suite of industry-standard capabilities for memory BIST, logic BIST, test
point insertion, and diagnostics, the solution can help designers reduce production
test costs and increase silicon profit margins. The Modus 2D elastic compression
is an exclusive-or compression logic that
forms a physically aware 2D grid across
the design floorplan, enabling higher
compression ratios with reduced wirelength. The software's unified compression provides an elegant combination of
scan compression and logic BIST, with the
same physical awareness of 2D Elastic.
Davies, Advantest: "Advantest is constantly developing and introducing new
solutions for the global test market. Just
this May, we announced a new software
enhancement, a module that extends
the capabilities of our well-established
T2000 tester, and a new test solution for
5G devices: The new V93000 SmartShell
software bridge directly links Advantest
testers with EDA environments, such
as Mentor's Tessent Silicon Insight, to
shorten cycle times and get new IC designs to market faster. Our new T2000
GPWGD module (general-purpose
waveform generator digitizer) enables
testing of high-resolution audio digitalto-analog converters (DACs) embedded
in power-management ICs (PMICs) for
next-generation audio applications. The
V93000 Wave Scale Millimeter system
is designed for highly parallel, multisite
testing of 5G and 5G-NR mmWave devices and also has the extendibility to
handle future needs such as beamforming and over-the-air testing
In addition, our recent acquisition of
Astronics' system-level-test products
further broadens our solutions portfolio."

14

EVALUATION ENGINEERING JULY 2019

Rohde & Schwarz' multiport VNA R&S ZNBT.

Arebi and Malatest, Per Vices: "Our newest release is Cyan, our latest SDR. This
multifunctional platform is ideal for RF,
as well as test and measurement systems.
Addressing many of the challenges facing semiconductor test today, Cyan offers users with a flexible, multichannel
solution, that features a customizable
number of transmit or receive channels
(up to 16 total radio channels) that can
be used in testing equipment for a variety
of applications and in order to perform
multiple duties simultaneously. Cyan aids
in accelerating the development and performance necessary to meet new requirements while reducing time-to-market."
Loerner, Rohde & Schwarz: "A vector
network analyzer can perform many RF
semiconductor tests. Rohde & Schwarz just
extended its multiport VNA R&S ZNBT to
40 GHz to address the evolving needs for
5G RF components. The multiport architecture allows parallel test on up to 24 ports.
Test on multiport devices, like phased array beamformers or parallel test, support
fastest characterization of production lots."
Stasonis, Pickering: "We have focused our
efforts on defining a "switching ecosystem", with software products like Switch
Path Manager (SPM) automatic signal
routing, test sequencing with hardware
triggering to improve throughput, developing higher isolation matrices for chip
and wafer testing, and working directly
with semiconductor manufacturers to
give them what they need. High pincount/isolation reed-relay matrices with
multiple analog buses and triggering/test
sequencing to support fast parallel testing, plus higher frequency microwave
switching are our recent contributions
to the industry."

Semancik, Marvin Test Solutions: "MTS'
GENASYS Semi (TS-900/960 Series) takes
full advantage of the PXI architecture to
achieve a cost-effective, full-featured test
solution for device, SoC, and SiP test applications, as well as supporting emerging technology development and test.
GENASYS Semi provides unique parallel test capabilities, greatly reducing test
times for 5G, while minimizing capital
equipment expenditures and maximizing the utilization of current test assets."
Keysight's PD1500A power device analyzer with
double-pulse tester.

Keysight Technologies: "On May 7,
Keysight announced a new dynamic
power device analyzer with doublepulse tester, PD1500A, to deliver reliable, repeatable measurements of widebandgap semiconductors, while ensuring
the safety of the measurement hardware
and the professionals performing the
tests. Keysight's PD1500A is designed to
be modular, allowing many device types
to be tested and different characterization tests to be performed at a variety of
power levels. The initial system provides
complete double-pulse test characterization and parameter extraction for Si and
SiC power semiconductors with ratings up
to 1.2 kV and 200 A. Additional modules
will be added to the PD1500A in the future
to perform tests on devices requiring more
current, such as GaN and power modules."
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Evaluation Engineering

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