Evaluation Engineering - 1
CONTENTS
JUNE 2019 | VOL. 58, NO. 6
VP & GROUP PUBLISHER Alan Bergstein
abergstein@endeavorb2b.com
EDITORIAL
EDITOR-IN-CHIEF Mike Hockett
mhockett@evaluationengineering.com
MANAGING EDITOR Ken Cormier
kcormier@evaluationengineering.com
6
CONTRIBUTING TECHNICAL EDITOR Rick Nelson
ADVERTISING
WEST
INSTRUMENTATION
PUBLISHER Clark Celmayster
ccelmayster@evaluationengineering.com
SPECIAL REPORT
EAST
SALES SPECIALIST Blake Holton
407-971-6286
bholton@evaluationengineering.com
PRODUCTION
ART DIRECTOR Julie Whitty
jwhitty@endeavorbusinessmedia.com
6
22
22
MARKETING MANAGER Nick Phillips
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The recent history
of today's high-end
oscilloscope technology
APPLICATIONS
DIGITAL OPERATIONS MANAGER Mary Beth Romano
SPECIAL REPORT
CIRCULATION
13
SUBSCRIPTIONS/BACK ISSUES
e-mail: EvaluationEngineering@Omeda.com
AUDIENCE DEVELOPMENT MANAGER Anna Hicks
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13
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Turnkey use, portability, and
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by Mike Hockett, Editor-in-Chief
PRODUCTION MANAGER Amanda Porter
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CORPORATE TEAM
DATA ACQUISITION SYSTEMS
DEPARTMENTS
2 Editorial
2 By the Numbers
4 Industry Report
26 Tech Focus
28 Featured Tech
30 IMS, Sensors Expo Preview
Facebook
facebook.com/EvaluationEngineering
24
RF/MICROWAVE TEST
5G brings new onslaught
of challenges
by Mike Hockett, Editor-in-Chief
ATE
Protecting AI chips
from thermal challenges
during ATE test
by Carl Peach and Yi Zhang
TECHNOLOGY INSIGHTS
32
SENSORS
Sensors open new
vistas in electronics
by Ken Cormier, Managing Editor
Cover photo: iStock.com/matejmo
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JUNE 2019 EVALUATIONENGINEERING.COM
1
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Evaluation Engineering
Table of Contents for the Digital Edition of Evaluation Engineering
Editor's Note: How safe are 5G signals?
By the Numbers
Industry Report
Tech Focus
Featured Tech
IMS, Sensors Expo Preview
Data Acquisition Systems: Turnkey use, portability, and real-time analysis among customers' DAQ must-haves
Oscilloscopes: The recent history of today's high-end oscilloscope technology
RE/Microwave Test: 5G Brings new onslaught of challenges
ATE: Protecting AI Chips from thermal challenges during ATE test
Sensors: Sensors open new vistas in electronics
Evaluation Engineering - Cover1
Evaluation Engineering - Cover2
Evaluation Engineering - 1
Evaluation Engineering - By the Numbers
Evaluation Engineering - 3
Evaluation Engineering - Industry Report
Evaluation Engineering - 5
Evaluation Engineering - Data Acquisition Systems: Turnkey use, portability, and real-time analysis among customers' DAQ must-haves
Evaluation Engineering - 7
Evaluation Engineering - 8
Evaluation Engineering - 9
Evaluation Engineering - 10
Evaluation Engineering - 11
Evaluation Engineering - 12
Evaluation Engineering - RE/Microwave Test: 5G Brings new onslaught of challenges
Evaluation Engineering - 14
Evaluation Engineering - 15
Evaluation Engineering - 16
Evaluation Engineering - 17
Evaluation Engineering - 18
Evaluation Engineering - 19
Evaluation Engineering - 20
Evaluation Engineering - 21
Evaluation Engineering - Oscilloscopes: The recent history of today's high-end oscilloscope technology
Evaluation Engineering - 23
Evaluation Engineering - ATE: Protecting AI Chips from thermal challenges during ATE test
Evaluation Engineering - 25
Evaluation Engineering - Tech Focus
Evaluation Engineering - 27
Evaluation Engineering - Featured Tech
Evaluation Engineering - 29
Evaluation Engineering - IMS, Sensors Expo Preview
Evaluation Engineering - 31
Evaluation Engineering - Sensors: Sensors open new vistas in electronics
Evaluation Engineering - Cover3
Evaluation Engineering - Cover4
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