Evaluation Engineering - 17
customers is the development of test fixtures, custom PCBs, and such that may
be beyond the current in-house capabilities of the organization or test team. This
includes the ability to work with chip and
wire (DIE) based parts and very expensive
high-frequency connectors and cables."
Randy L. Oltman, marketing and system
applications manager, Instrumentation
Market Group at Analog Devices: "The
testing of devices for sub-6GHz looks
a lot like the testing of sub-6GHz LTE
devices and generations before. The biggest 5G Test & Measurement challenges
ahead are almost all related to mmW.
The most significant is the definition
of an all-OTA (over-the-air) production test method for mobile devices.
This is an area currently under study
by many suppliers as conducted mode
testing at mmW looks unworkable. An
all-OTA production test is a significant
change to established test methodologies
challenging the existing norms of tester
footprint, test throughput, and overall
cost of test. Obviously, a significant part
of a viable OTA tester is the quality of
the mmW signal delivered at very highpower levels."
Infinite
Electronics'
40 GHz Skew
Matched Cable Pairs.
Infinite Electronics, via Pasternack subsidiary: "In order to implement multi-user
MIMO (Mu-MIMO) and carrier aggregation, many modem chips are necessary,
along with a substantial amount of RF
routing. Moreover, the use of such highspeed modems also leads to the use of
high-speed digital interfaces that run at
several Gbps. Though much of these new
sub-6 GHz modem/radio/antennas would
ideally be integrated, the sheer volume
of RF/high-speed ports and pathways
creates a substantial RF interconnect
challenge during prototyping, testing,
production, and even troubleshooting/
maintenance."
Nichols, Keysight: "The challenges include
not just the higher frequencies-which
mean more sophisticated simulation
and measurement solutions, but also
the companion of mmW-higher bandwidths. This means much faster baseband
processing, adjacent channel measurement challenges, f latness (amplitude
and phase) in the in-band response, and
so on. At <6GHz, many challenges arise
here-not just wider bandwidths for single-component carriers, but the added
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Evaluation Engineering
Table of Contents for the Digital Edition of Evaluation Engineering
Editor's Note: How safe are 5G signals?
By the Numbers
Industry Report
Tech Focus
Featured Tech
IMS, Sensors Expo Preview
Data Acquisition Systems: Turnkey use, portability, and real-time analysis among customers' DAQ must-haves
Oscilloscopes: The recent history of today's high-end oscilloscope technology
RE/Microwave Test: 5G Brings new onslaught of challenges
ATE: Protecting AI Chips from thermal challenges during ATE test
Sensors: Sensors open new vistas in electronics
Evaluation Engineering - Cover1
Evaluation Engineering - Cover2
Evaluation Engineering - 1
Evaluation Engineering - By the Numbers
Evaluation Engineering - 3
Evaluation Engineering - Industry Report
Evaluation Engineering - 5
Evaluation Engineering - Data Acquisition Systems: Turnkey use, portability, and real-time analysis among customers' DAQ must-haves
Evaluation Engineering - 7
Evaluation Engineering - 8
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Evaluation Engineering - RE/Microwave Test: 5G Brings new onslaught of challenges
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Evaluation Engineering - 19
Evaluation Engineering - 20
Evaluation Engineering - 21
Evaluation Engineering - Oscilloscopes: The recent history of today's high-end oscilloscope technology
Evaluation Engineering - 23
Evaluation Engineering - ATE: Protecting AI Chips from thermal challenges during ATE test
Evaluation Engineering - 25
Evaluation Engineering - Tech Focus
Evaluation Engineering - 27
Evaluation Engineering - Featured Tech
Evaluation Engineering - 29
Evaluation Engineering - IMS, Sensors Expo Preview
Evaluation Engineering - 31
Evaluation Engineering - Sensors: Sensors open new vistas in electronics
Evaluation Engineering - Cover3
Evaluation Engineering - Cover4
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