Evaluation Engineering - 27
Snap-action switches in two sizes
CIT Relay & Switch offers the miniature VM3 and sub-miniature
SM3 Series snap-action switches. Available in either SPST
or SPDT, these UL/cUL recognized switches offer numerous
actuator styles including pin plunger, standard, short and long
hinge levers, roller and simulated roller. Termination options
include .110" quick connect, solder lug, PC terminal, and right or
left PC terminal. Contact material on the VM3 and SM3 Series is
silver and both offer choices of operating force. Ratings are up to
16amps at 125VAC/250VAC and IP67 versions are available. CIT
Relay & Switch also offer customization of its snap-action switch
to fit customer's exact requirements.
CIT Relay & Switch
Sliding power connector
TE Connectivity (TE), has introduced a sliding power connector.
This is one of the only connectors of its kind that allows for hot
swapping (serviceability) of components in a server drawer
without shutting power down to the entire system. Designed
for applications such as hard disk drives, power supply units,
racks, servers, storage units, and other high-current applications,
the sliding power connector saves significant operational costs
because it can reduce the need for system downtime that is
normally required when swapping server drawer components.
The sliding power connector can also minimize the need for a bulky
cable management system within the drawer, opening up more
space for airflow and reducing overall cooling costs. It also shows
improved voltage drop over cables due to a more direct path from
the power source to the server, increasing energy efficiency.
TE Connectivity
MAY 2019 EVALUATIONENGINEERING.COM
27
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Evaluation Engineering
Table of Contents for the Digital Edition of Evaluation Engineering
Editorial: The Current State of 5G Wireless Service
By the Numbers
Industry Report
Modular Instruments: Amid 5G and IIoT's evolution, demand for modular instrumentation hits new heights
Cybersecurity: How vendors are shielding against the dark side
Memory: What is NVMe-oF interop testing and why is it important?
Semiconductor Test: 1000A high-current RDSon static parameter DC testing vs. pulse testing at 300µs
EE's Sights from APEC 2019
Tech Focus
Featured Tech
Industrial Internet of Things - IIoT 2019: The industrial Revolution keeps on ticking
Evaluation Engineering - Cover1
Evaluation Engineering - Cover2
Evaluation Engineering - 1
Evaluation Engineering - 2
Evaluation Engineering - 3
Evaluation Engineering - By the Numbers
Evaluation Engineering - 5
Evaluation Engineering - Industry Report
Evaluation Engineering - 7
Evaluation Engineering - Modular Instruments: Amid 5G and IIoT's evolution, demand for modular instrumentation hits new heights
Evaluation Engineering - 9
Evaluation Engineering - 10
Evaluation Engineering - 11
Evaluation Engineering - 12
Evaluation Engineering - 13
Evaluation Engineering - Cybersecurity: How vendors are shielding against the dark side
Evaluation Engineering - 15
Evaluation Engineering - Memory: What is NVMe-oF interop testing and why is it important?
Evaluation Engineering - 17
Evaluation Engineering - Semiconductor Test: 1000A high-current RDSon static parameter DC testing vs. pulse testing at 300µs
Evaluation Engineering - 19
Evaluation Engineering - 20
Evaluation Engineering - 21
Evaluation Engineering - EE's Sights from APEC 2019
Evaluation Engineering - 23
Evaluation Engineering - 24
Evaluation Engineering - 25
Evaluation Engineering - Tech Focus
Evaluation Engineering - 27
Evaluation Engineering - Featured Tech
Evaluation Engineering - 29
Evaluation Engineering - 30
Evaluation Engineering - 31
Evaluation Engineering - Industrial Internet of Things - IIoT 2019: The industrial Revolution keeps on ticking
Evaluation Engineering - Cover3
Evaluation Engineering - Cover4
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