Evaluation Engineering - 8
INSTRUMENTATION
SPECIAL REPORT
LET'S GET MODULAR
As 5G and IIoT keep evolving, the demand for
modular instrumentation grows to new heights
By Mike Hockett, Editor-in-Chief
With each passing year, modular instruments gain ever-more capabilities that were once only possible with
benchtop instruments. Assembling a
complete test system once required a
rack-mount enclosure and multiple other
rack-mounted benchtop instruments,
along with separate benchtop instruments installed w ithin the rack.
Sometimes this required specialized software to operate everything together. Now,
an equivalent test system can be formed
by inserting instrument modules into one
chassis.
As increasingly more test engineers
have gained comfort with those modular capabilities and the flexibility such
instruments offer, the market for modular
technology is positioned for considerable
8
EVALUATION ENGINEERING MAY 2019
growth for quite some time as its demand
rises in the electronic test field.
A report released in August 2018 by research firm MarketsAndMarkets stated
the modular instruments market was
valued at $1.12 billion in 2017 and is expected to nearly double by 2023 to $2.11
billion, growing at a CAGR of 9.6% from
2018 to 2023. Applications in 5G R&D and
infrastructure, along with IoT and IIoT,
appear ripe for testing with modular instruments, with one of the only market
restraints being the increased penetration
of rental and leasing services, as opposed
to pure product selling.
We at Evaluation Engineering gathered
commentary from a handful of vendors
of modular instruments to get their
thoughts on the topics of trends, customer
demands, vendor challenges, the outlook
for PXI, LXI, and VXI, and what new solutions they've put on the market.
What's trending?
Here's what vendors told EE they're seeing
as new or growing trends in the modular
instrumentation market.
Bob Stasonis, technical product specialist for Pickering Interfaces: "Modular
standards like PXI are implemented
in virtually every test application in
the electronics industry," Pickering
Interfaces technical product specialist
Bob Stasonis told EE. "There are also
proprietary standards by instrumentation manufacturers that allow their
products to be easily reconfigured and
scaled. What is really interesting is that
other nonmodular standards are going
modular. Several companies are taking
the LXI and USB interfaces and controlling modular switching and instrumentation. Such a trend extends the possibilities of modular test in areas like remote
testing and diagnostics and isolation of
high-power modules from more sensitive
instrumentation."
Evaluation Engineering
Table of Contents for the Digital Edition of Evaluation Engineering
Editorial: The Current State of 5G Wireless Service
By the Numbers
Industry Report
Modular Instruments: Amid 5G and IIoT's evolution, demand for modular instrumentation hits new heights
Cybersecurity: How vendors are shielding against the dark side
Memory: What is NVMe-oF interop testing and why is it important?
Semiconductor Test: 1000A high-current RDSon static parameter DC testing vs. pulse testing at 300µs
EE's Sights from APEC 2019
Tech Focus
Featured Tech
Industrial Internet of Things - IIoT 2019: The industrial Revolution keeps on ticking
Evaluation Engineering - Cover1
Evaluation Engineering - Cover2
Evaluation Engineering - 1
Evaluation Engineering - 2
Evaluation Engineering - 3
Evaluation Engineering - By the Numbers
Evaluation Engineering - 5
Evaluation Engineering - Industry Report
Evaluation Engineering - 7
Evaluation Engineering - Modular Instruments: Amid 5G and IIoT's evolution, demand for modular instrumentation hits new heights
Evaluation Engineering - 9
Evaluation Engineering - 10
Evaluation Engineering - 11
Evaluation Engineering - 12
Evaluation Engineering - 13
Evaluation Engineering - Cybersecurity: How vendors are shielding against the dark side
Evaluation Engineering - 15
Evaluation Engineering - Memory: What is NVMe-oF interop testing and why is it important?
Evaluation Engineering - 17
Evaluation Engineering - Semiconductor Test: 1000A high-current RDSon static parameter DC testing vs. pulse testing at 300µs
Evaluation Engineering - 19
Evaluation Engineering - 20
Evaluation Engineering - 21
Evaluation Engineering - EE's Sights from APEC 2019
Evaluation Engineering - 23
Evaluation Engineering - 24
Evaluation Engineering - 25
Evaluation Engineering - Tech Focus
Evaluation Engineering - 27
Evaluation Engineering - Featured Tech
Evaluation Engineering - 29
Evaluation Engineering - 30
Evaluation Engineering - 31
Evaluation Engineering - Industrial Internet of Things - IIoT 2019: The industrial Revolution keeps on ticking
Evaluation Engineering - Cover3
Evaluation Engineering - Cover4
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