Evaluation Engineering - 21

Figure 7: Defect classification for functional safety analysis.

Designers can also generate other
FMEDA (failure modes, effects, and diagnostic analysis) related hardware safety
metrics defined within the ISO 26262
standard. Tessent DefectSim is able produce reports suitable to support FMEDA
creation.

Conclusion
Meeting the quality and reliability requirements of ISO 26262 and other automotive
electronics standards becomes more difficult as device sizes and complexities
continue to grow. Both the digital and

analog portions of the chip must be fully
addressed. The introduction of automation
into the analysis and insertion of functional safety is allowing more comprehensive
safety solutions to be implemented and
qualified. They utilize in-system BIST solutions, such as logic BIST and nondestructive memory BIST, together with more conventional functional-safety mechanisms.
These advancements, along with the adoption of advanced test capabilities such as
automotive-grade ATPG for manufacturing test, will not only improve the ability of
semiconductor manufacturers to achieve

necessary quality and reliability metrics
but will also help to further differentiate
their products by delivering embedded
test capabilities that can be leveraged by
their customers at the system level and in
the field. In addition, the calculation and
delivery of failure metrics is also quickly
becoming a key deliverable toward meeting necessary system functional safety
goals.
Lee Harrison is Automotive IC Test Solutions
Manager with Mentor, A Siemens Business.
He has over 20 years of industry experience
with Mentor DFT products and has been
involved in the specification of new test
features and methodologies for Mentor customers, delivering high-quality DFT solutions.
With a focus on automotive, Lee is working
to ensure that current and future DFT requirements of Mentor's automotive customers are
understood and met. Lee Received his BEng
in MicroElectronic Engineering from Brunel
University London in 1996.

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