Evaluation Engineering - 24

AUTOMATED TEST

RECOMMENDATION OF VOLTAGE
LINE DISTURBANCE TEST
by Takemi Iguchi
It seems that everyone is testing
IEC61000-4-11 in order to obtain CB
certification and international certification (CE marking etc.). The IEC61000-4-11
standard specifies voltage dip, short interruptions, and voltage variation immunity
tests. The class determines test level and
duration. Regarding judgments, the level
of performance standard required is different, depending on each standard required of EUT.
Is it enough to do this test as immunity
tolerance in the actual field? Not in my
experience. This is especially true if it is
intended to be used in countries and regions with insufficient power infrastructure. In the worst case, the equipment
will fail. So, I recommend that you test
thoroughly before releasing the product
to make sure that the problem does not
occur (Figures 1 and 2).

Figure 1. The
voltage decreases
to 40% for 10
periods.

Figure 2. The
voltage decreases
to 0% for 0.5 period.

Table 1. Test level and durations for voltage dips.

Class*

Test level and durations for voltage dips (50Hz/60Hz)

Class 1

Case-by-case according to the equipment requirements

Class 2

0%, 0.5 cycle

0%, 1 cycle

70%, 25/30 cycle

Class 3

0%, 0.5 cycle

0%, 1 cycle

40%, 10/12 cycle***

70%, 25/30 cycle***

80%, 250/300 cycle***

Class X**

X

X

X

X

X

* Classes as per IEC61000-2-4; see Annex B.
** To be defined by product committee. For equipment connected directly or indirectly to the public network, the levels must be less severe than Class 2.
*** 25/30 cycle = 25 cycles for 50Hz test and 30 cycles for 60Hz test

24

EVALUATION ENGINEERING NOVEMBER 2019



Evaluation Engineering

Table of Contents for the Digital Edition of Evaluation Engineering

Editorial: Three-way race to the future
By the Numbers
Industry Report
Signal Generators: New technology demands make signal generators more integral to testing
Burn-In and Test: The importance of burn-in and test extends from semiconductors to military equipment
Automotive Test: Automation boosts analog and digital test of automotive ICs
Sensor-Based Test: The 3R's of analog position sensor-based mechanical measurements
Power Test: Recommendation of voltage line disturbance test
Featured Tech
Tech Focus
Semiconductors: Heterogeneous integration ramps up electronics clout
Evaluation Engineering - Cover1
Evaluation Engineering - Cover2
Evaluation Engineering - 1
Evaluation Engineering - By the Numbers
Evaluation Engineering - 3
Evaluation Engineering - Industry Report
Evaluation Engineering - 5
Evaluation Engineering - Signal Generators: New technology demands make signal generators more integral to testing
Evaluation Engineering - 7
Evaluation Engineering - 8
Evaluation Engineering - 9
Evaluation Engineering - 10
Evaluation Engineering - 11
Evaluation Engineering - 12
Evaluation Engineering - Burn-In and Test: The importance of burn-in and test extends from semiconductors to military equipment
Evaluation Engineering - 14
Evaluation Engineering - 15
Evaluation Engineering - Automotive Test: Automation boosts analog and digital test of automotive ICs
Evaluation Engineering - 17
Evaluation Engineering - 18
Evaluation Engineering - 19
Evaluation Engineering - 20
Evaluation Engineering - 21
Evaluation Engineering - Sensor-Based Test: The 3R's of analog position sensor-based mechanical measurements
Evaluation Engineering - 23
Evaluation Engineering - Power Test: Recommendation of voltage line disturbance test
Evaluation Engineering - 25
Evaluation Engineering - 26
Evaluation Engineering - 27
Evaluation Engineering - Featured Tech
Evaluation Engineering - 29
Evaluation Engineering - Tech Focus
Evaluation Engineering - 31
Evaluation Engineering - Semiconductors: Heterogeneous integration ramps up electronics clout
Evaluation Engineering - Cover3
Evaluation Engineering - Cover4
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