Evaluation Engineering - 27
t
n
e
r
fe
f
i
d
0
communication commands, so let's program and test:
1. Sample program
flow and code
Start
Ini�alize
Simula�on Run
STOP?
Increment angle
< 360 deg
Phase?
= 360 deg
Increment dura�on
< 5 sec
Dura�on?
= 5 sec
2. Change both the
immersion time and
angle at the time of
short interruptions
to 0, 45, 90, 135,
180, 225, 270, and
315 degrees. This is
to test at the point
where the current
value is maximum.
13
5 MS/s to 5 GS/s speed
1 to 8 channels (cards)
2 to 48 channels (Ethernet-units)
3. After initialization,
the program
performs power
line disturbance
simulation, monitors
the status by polling,
and waits for the
status to stop
4. Then, change the
phase and let it
repeat until it
reaches 360 degrees
5. When reaching 360
degrees, increase
the immersion time
and run as a phase
of 0 degrees. Repeat
this.
End
6. It is recommended
that you run this test
with the test object
output at maximum load. Proceed while checking that the
device under test does not break down or malfunction.
s
r
e
z
i
digit
s
G
W
A
t
n
e
r
e
f
f
i
5d
4
40 MS/s to 1.25 GS/s speed
1 to 8 channels (cards)
2 to 48 channels (Ethernet-units)
Summary
A high-performance, multifunctional AC power supply series
could easily test for voltage dips and short interruptions, as well
as repeat the testing while changing parameters. Using SCPI
commands, one could easily create a test program. Use this
function to test not only the required test level and duration
of the standard, but also the operation under the worst condition. You can prevent problems in the market, and it should be
useful for you.
Takemi Iguchi is a technical advisory manager at
Kikusui America, and has been with the company's
development division for more than 19 years.
SPECTRUM
I N S T R U M E N T A T I O N
Pe r f e c t f i t - m o d u l a r d e s i g n e d s o l u t i o n s
US: Phone (201) 562 1999 | Asia / Europe: Phone +49 (4102) 695 60
www.spectrum-instrumentation.com
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Evaluation Engineering
Table of Contents for the Digital Edition of Evaluation Engineering
Editorial: Three-way race to the future
By the Numbers
Industry Report
Signal Generators: New technology demands make signal generators more integral to testing
Burn-In and Test: The importance of burn-in and test extends from semiconductors to military equipment
Automotive Test: Automation boosts analog and digital test of automotive ICs
Sensor-Based Test: The 3R's of analog position sensor-based mechanical measurements
Power Test: Recommendation of voltage line disturbance test
Featured Tech
Tech Focus
Semiconductors: Heterogeneous integration ramps up electronics clout
Evaluation Engineering - Cover1
Evaluation Engineering - Cover2
Evaluation Engineering - 1
Evaluation Engineering - By the Numbers
Evaluation Engineering - 3
Evaluation Engineering - Industry Report
Evaluation Engineering - 5
Evaluation Engineering - Signal Generators: New technology demands make signal generators more integral to testing
Evaluation Engineering - 7
Evaluation Engineering - 8
Evaluation Engineering - 9
Evaluation Engineering - 10
Evaluation Engineering - 11
Evaluation Engineering - 12
Evaluation Engineering - Burn-In and Test: The importance of burn-in and test extends from semiconductors to military equipment
Evaluation Engineering - 14
Evaluation Engineering - 15
Evaluation Engineering - Automotive Test: Automation boosts analog and digital test of automotive ICs
Evaluation Engineering - 17
Evaluation Engineering - 18
Evaluation Engineering - 19
Evaluation Engineering - 20
Evaluation Engineering - 21
Evaluation Engineering - Sensor-Based Test: The 3R's of analog position sensor-based mechanical measurements
Evaluation Engineering - 23
Evaluation Engineering - Power Test: Recommendation of voltage line disturbance test
Evaluation Engineering - 25
Evaluation Engineering - 26
Evaluation Engineering - 27
Evaluation Engineering - Featured Tech
Evaluation Engineering - 29
Evaluation Engineering - Tech Focus
Evaluation Engineering - 31
Evaluation Engineering - Semiconductors: Heterogeneous integration ramps up electronics clout
Evaluation Engineering - Cover3
Evaluation Engineering - Cover4
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