Aerospace and Electronic Systems - August 2018 - 29
Varizat et al.
age drifts increase more rapidly start from 150 K up to room temperature to reach a 9 mV maximum drift.
[6]
CONCLUSION
A cryogenic study of a commercial standard 0.35 μm/3.3 V bulk
CMOS technology between 77 K and 300 K has been presented.
As expected, a deviation, growing with decreasing temperature between measurements and foundry-based models simulations is observed and is being assigned to low temperature physical phenomena, like charged particle freeze-out effect. We extracted BSIM3.3
parameters to generate low temperature models of this technology.
These new models present good results on a large temperature
range from 77 K to 400 K. We used these models to successfully
design a full CMOS reference voltage with only 20 ppm/K between 100 K and 150 K.
ACKNOWLEDGEMENT
[7]
[8]
[9]
[10]
[11]
This work was supported by CNRS (Centre National de la Recherche Scientifique) and CNES (Centre National d'Etudes Spatiales)
as part as the JUICE/RPWI/SCM instrument.
[12]
REFERENCES
[1]
[2]
[3]
[4]
[5]
Srour, J. R., and Mcgarrity, J. M. Radiation effects on microelectronics in space. Proceedings of the IEEE, Vol. 76, 11 (1988),
1443-1469.
Coillot, C. "Induction magnetometers principle, modeling and ways
of improvement. In Magnetic Sensors-Principles and Applications,
K. Kuang, Ed. Intech, Mar. 2012, pp. 1-21. [Online]. Available: https:
//hal.archives-ouvertes.fr/hal-00867616.
Ramos-Martos, J., Ragel-Morales, A., Ceballos-Cceres, J., Mora-Gutirrez, J. M., Lagos-Florido, M. A., and Espejo-Meana, S.
Evaluation of the AMS 0.35 m CMOS technology for use in space
applications. 2012. [Online]. Available: http://digital.csic.es/handle/10261/84095.
Varizat, L., Sou, G., and Mansour, M. BSIM3 parameters extraction of
a 0.35 m CMOS technology from 300k down to 77k. Journal of Physics: Conference Series, Vol. 834, 1 (2017), 012002. [Online]. Available: http://stacks.iop.org/1742-6596/834/i=1/a=012002.
Dao, N. C., Kass, A. E., Azghadi, M. R., Jin, C. T., Scott, J., and
Leong, P. H. An enhanced MOSFET threshold voltage model for
the 6300K temperature range. Microelectronics Reliability, Vol. 69,
AUGUST 2018
[13]
[14]
[15]
[16]
[17]
[18]
IEEE A&E SYSTEMS MAGAZINE
(2016), 36-39. [Online]. Available: http://dx.doi.org/10.1016/j.microrel.2016.12.007.
Canali, C., Jacoboni, C., Nava, F., Ottaviani, G., and Alberigi-Quaranta, A. Electron drift velocity in silicon. Physical Review, Vol. 12, 4
(1975), 2265-2284.
Ottaviani, G., Reggiani, L., Canali, C., Nava, F., and Alberigi-Quaranta, A. Hole drift velocity in silicon. Physics Review B, Vol. 12,
(Oct. 1975), 3318-3329. [Online]. Available: https://link.aps.org/
doi/10.1103/PhysRevB.12.3318.
Morin, F. J., and Maita, J. P. Electrical properties of silicon containing arsenic and boron. Physics Review, Vol. 96, (Oct. 1954), 28-35.
[Online]. Available: https://link.aps.org/doi/10.1103/PhysRev.96.28.
Street, R. A. Doping and the Fermi energy in amorphous silicon.
Physical Review Letters, Vol. 49, 16 (Oct. 1982), 1187-1190. [Online]. Available: http://link.aps.org/doi/10.1103/PhysRevLett.49.1187.
Balestra, F., Audaire, L., and Lucas, C. Influence of substrate freezeout on the characteristics of MOS transistors at very low temperatures.
Solid State Electronics, Vol. 30, 3 (1987), 321-327.
Sheu, B. J., Scharfetter, D. L., Ko, P. K., and Jeng, M. C. BSIM:
Berkeley short-channel IGFET model for MOS transistors. IEEE
Journal of Solid-State Circuits, Vol. 22, (1987), 558-566.
Jia, K., Sun, W., and Shi, L. A sub-circuit MOSFET model with a
wide temperature range including cryogenic temperature. Journal of
Semiconductors, Vol. 32, 6 (Jun. 2011), 064002. [Online]. Available:
http://stacks.iop.org/1674-4926/32/i=6/a=064002?key=crossref.e3cfc1a8b488df63b355f9938e0294db.
Zhao, H., and Liu, X. Modeling of a standard 0.35m CMOS technology operating from 77k to 300k. Cryogenics, Vol. 59, (Jan. 2014),
49-59. [Online]. Available: http://linkinghub.elsevier.com/retrieve/
pii/S0011227513000969.
Mok, P., and Leung, K. N. L. K. N. Design considerations of recent advanced low-voltage low-temperature-coefficient CMOS bandgap voltage reference. Proceedings of the IEEE 2004 Custom Integrated Circuits Conference (IEEE Cat. No. 04CH37571), no. 29, 2004, 635-642.
Miller, P., and Moore, D. Precision voltage references. Analog Application Journal, (1999), 1-4.
Andreou, C. M., Koudounas, S., and Georgiou, J. A novel wide-temperature-range, 3.9 ppm/°C CMOS bandgap reference circuit. IEEE
Journal of Solid-State Circuits, Vol. 47, 2 (2012), 574-581.
Leung, K. N., and Mok, P. K. A CMOS voltage reference based on
weighted/SPL Delta/V/Sub GS/for CMOS low-dropout linear regulators. IEEE Journal of Solid-State Circuits, Vol. 38, 1 (2003), 146-150.
Leung, K. N., Mok, K. T. P., and Kwok, K. C. "CMOS voltage reference. U.S. Patent 6,441,680, Aug. 27, 2002.
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http://dx.doi.org/10.1016/j.microrel.2016.12.007
http://dx.doi.org/10.1016/j.microrel.2016.12.007
https://link.aps.org/doi/10.1103/physrevb.12.3318c
https://link.aps.org/doi/10.1103/physrevb.12.3318c
https://link.aps.org/doi/10.1103/PhysRev.96.28
http://link.aps.org/doi/10.1103/PhysRevLett.49.1187
http://stacks.iop.org/1674-4926/32/i=6/a=064002?key=crossref.e3cfcla8b488df63b355f9938e0294db
http://stacks.iop.org/1674-4926/32/i=6/a=064002?key=crossref.e3cfcla8b488df63b355f9938e0294db
http://linkinghub.elsevier.com/retrieve/pii/S0011227513000969
http://linkinghub.elsevier.com/retrieve/pii/S0011227513000969
http://digital.csic.es/handle/10261/84095
http://digital.csic.es/handle/10261/84095
http://stacks.iop.org/1742-6596/834/i=1/a=012002
Aerospace and Electronic Systems - August 2018
Table of Contents for the Digital Edition of Aerospace and Electronic Systems - August 2018
Contents
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Aerospace and Electronic Systems - August 2018 - Contents
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