IEEE Circuits and Systems Magazine - Q3 2021 - 25

This paper reviewed numerous post-CMOS devices and
their unique characteristics used for hardware security
applications. This study revealed the CMOS technology
challenges and benefits of emerging devices for the design
of hardware security primitives and methodologies.
The unique properties of beyond-CMOS devices enable
several benefits for hardware security primitives (PUF
and TRNG), variety of side-channel analysis countermeasures,
and hardware obfuscation techniques.
This investigation reported the best suitable emerging
Table 7.
Summary of emerging device candidates and state-of-the-art countermeasures.
Hardware security primitives/methodologies
demonstrated
Device
candidate
TFET
STT-MTJ
Device characteristics
exploited for security
Lower subthreshold
swing, p-i-n forward
leakage, ambipolarity
Stochastic variation
in switching, uniform
power consumption if no
switching
HyperFET
SymFET
SiNWFET
RRAM
CNTFET
PCM
Fast abrupt transition and
hysteresis
Bell-shaped I-V
characteristics
Tunable polarity
Variability in RRAM
resistance
Strong process
variations, inherent
randomness
Variation in cell
resistance, forming step,
threshold dispersion
✔
✔
✔
✔
✔
✔
✔
TRNG
✔
✔
PUF
SCA
countermeasures
✔
✔
✔
Hardware
obfuscation
✔
✔
Device challenges
for future research
Low ON-current,
enhanced miller
capacitance effect
High write
current, high read
disturbance
✔
✔
✔
✔
Selection of PTM to
have lower transition
time
High leakage and
scalability issue
Subthreshold swing
limit (60mV/dec)
Limited endurance,
poor data retention
Imprecise alignment
of CNTs, inaccurate
density distribution
Programming the
PCM cell, high
programming
current
Table 8.
Performance comparison of emerging devices based hardware security countermeasures.
TRNG
Device
candidate
CMOS
STT-MTJ
TFET
RRAM
E
(pJ/bit)
Ultra
high
Ultra
low
High
Ultra
high
A
(µm2)
Ultra
high
Low
Ultra
low
Ultra
low
Device
candidate
STT-MTJ
PCM
CNTFET
RRAM
PUF
E
(pJ/bit) U (%) R (%)
Low
High
Ultra
low
High
High
High
High
Ultra
High
High
High
High
Ultra
High
Device
candidate
TFET
STT-MTJ
HyperFET
RRAM
SCA countermeasures
P
reduction
Ultra high
High
Ultra low
High
E-Energy consumption, A-Circuit/system area, U-Uniqueness, R-Reliability, P-Power consumption, MTD- Measurement to disclosure
THIRD QUARTER 2021
IEEE CIRCUITS AND SYSTEMS MAGAZINE
25
MTD
increment
High
Ultra high
High
High

IEEE Circuits and Systems Magazine - Q3 2021

Table of Contents for the Digital Edition of IEEE Circuits and Systems Magazine - Q3 2021

Contents
IEEE Circuits and Systems Magazine - Q3 2021 - Cover1
IEEE Circuits and Systems Magazine - Q3 2021 - Cover2
IEEE Circuits and Systems Magazine - Q3 2021 - Contents
IEEE Circuits and Systems Magazine - Q3 2021 - 2
IEEE Circuits and Systems Magazine - Q3 2021 - 3
IEEE Circuits and Systems Magazine - Q3 2021 - 4
IEEE Circuits and Systems Magazine - Q3 2021 - 5
IEEE Circuits and Systems Magazine - Q3 2021 - 6
IEEE Circuits and Systems Magazine - Q3 2021 - 7
IEEE Circuits and Systems Magazine - Q3 2021 - 8
IEEE Circuits and Systems Magazine - Q3 2021 - 9
IEEE Circuits and Systems Magazine - Q3 2021 - 10
IEEE Circuits and Systems Magazine - Q3 2021 - 11
IEEE Circuits and Systems Magazine - Q3 2021 - 12
IEEE Circuits and Systems Magazine - Q3 2021 - 13
IEEE Circuits and Systems Magazine - Q3 2021 - 14
IEEE Circuits and Systems Magazine - Q3 2021 - 15
IEEE Circuits and Systems Magazine - Q3 2021 - 16
IEEE Circuits and Systems Magazine - Q3 2021 - 17
IEEE Circuits and Systems Magazine - Q3 2021 - 18
IEEE Circuits and Systems Magazine - Q3 2021 - 19
IEEE Circuits and Systems Magazine - Q3 2021 - 20
IEEE Circuits and Systems Magazine - Q3 2021 - 21
IEEE Circuits and Systems Magazine - Q3 2021 - 22
IEEE Circuits and Systems Magazine - Q3 2021 - 23
IEEE Circuits and Systems Magazine - Q3 2021 - 24
IEEE Circuits and Systems Magazine - Q3 2021 - 25
IEEE Circuits and Systems Magazine - Q3 2021 - 26
IEEE Circuits and Systems Magazine - Q3 2021 - 27
IEEE Circuits and Systems Magazine - Q3 2021 - 28
IEEE Circuits and Systems Magazine - Q3 2021 - 29
IEEE Circuits and Systems Magazine - Q3 2021 - 30
IEEE Circuits and Systems Magazine - Q3 2021 - 31
IEEE Circuits and Systems Magazine - Q3 2021 - 32
IEEE Circuits and Systems Magazine - Q3 2021 - 33
IEEE Circuits and Systems Magazine - Q3 2021 - 34
IEEE Circuits and Systems Magazine - Q3 2021 - 35
IEEE Circuits and Systems Magazine - Q3 2021 - 36
IEEE Circuits and Systems Magazine - Q3 2021 - 37
IEEE Circuits and Systems Magazine - Q3 2021 - 38
IEEE Circuits and Systems Magazine - Q3 2021 - 39
IEEE Circuits and Systems Magazine - Q3 2021 - 40
IEEE Circuits and Systems Magazine - Q3 2021 - 41
IEEE Circuits and Systems Magazine - Q3 2021 - 42
IEEE Circuits and Systems Magazine - Q3 2021 - 43
IEEE Circuits and Systems Magazine - Q3 2021 - 44
IEEE Circuits and Systems Magazine - Q3 2021 - 45
IEEE Circuits and Systems Magazine - Q3 2021 - 46
IEEE Circuits and Systems Magazine - Q3 2021 - 47
IEEE Circuits and Systems Magazine - Q3 2021 - 48
IEEE Circuits and Systems Magazine - Q3 2021 - 49
IEEE Circuits and Systems Magazine - Q3 2021 - 50
IEEE Circuits and Systems Magazine - Q3 2021 - 51
IEEE Circuits and Systems Magazine - Q3 2021 - 52
IEEE Circuits and Systems Magazine - Q3 2021 - 53
IEEE Circuits and Systems Magazine - Q3 2021 - 54
IEEE Circuits and Systems Magazine - Q3 2021 - 55
IEEE Circuits and Systems Magazine - Q3 2021 - 56
IEEE Circuits and Systems Magazine - Q3 2021 - 57
IEEE Circuits and Systems Magazine - Q3 2021 - 58
IEEE Circuits and Systems Magazine - Q3 2021 - 59
IEEE Circuits and Systems Magazine - Q3 2021 - 60
IEEE Circuits and Systems Magazine - Q3 2021 - 61
IEEE Circuits and Systems Magazine - Q3 2021 - 62
IEEE Circuits and Systems Magazine - Q3 2021 - 63
IEEE Circuits and Systems Magazine - Q3 2021 - 64
IEEE Circuits and Systems Magazine - Q3 2021 - 65
IEEE Circuits and Systems Magazine - Q3 2021 - 66
IEEE Circuits and Systems Magazine - Q3 2021 - 67
IEEE Circuits and Systems Magazine - Q3 2021 - 68
IEEE Circuits and Systems Magazine - Q3 2021 - 69
IEEE Circuits and Systems Magazine - Q3 2021 - 70
IEEE Circuits and Systems Magazine - Q3 2021 - 71
IEEE Circuits and Systems Magazine - Q3 2021 - 72
IEEE Circuits and Systems Magazine - Q3 2021 - 73
IEEE Circuits and Systems Magazine - Q3 2021 - 74
IEEE Circuits and Systems Magazine - Q3 2021 - 75
IEEE Circuits and Systems Magazine - Q3 2021 - 76
IEEE Circuits and Systems Magazine - Q3 2021 - 77
IEEE Circuits and Systems Magazine - Q3 2021 - 78
IEEE Circuits and Systems Magazine - Q3 2021 - 79
IEEE Circuits and Systems Magazine - Q3 2021 - 80
IEEE Circuits and Systems Magazine - Q3 2021 - 81
IEEE Circuits and Systems Magazine - Q3 2021 - 82
IEEE Circuits and Systems Magazine - Q3 2021 - 83
IEEE Circuits and Systems Magazine - Q3 2021 - 84
IEEE Circuits and Systems Magazine - Q3 2021 - 85
IEEE Circuits and Systems Magazine - Q3 2021 - 86
IEEE Circuits and Systems Magazine - Q3 2021 - 87
IEEE Circuits and Systems Magazine - Q3 2021 - 88
IEEE Circuits and Systems Magazine - Q3 2021 - 89
IEEE Circuits and Systems Magazine - Q3 2021 - 90
IEEE Circuits and Systems Magazine - Q3 2021 - 91
IEEE Circuits and Systems Magazine - Q3 2021 - 92
IEEE Circuits and Systems Magazine - Q3 2021 - 93
IEEE Circuits and Systems Magazine - Q3 2021 - 94
IEEE Circuits and Systems Magazine - Q3 2021 - 95
IEEE Circuits and Systems Magazine - Q3 2021 - 96
IEEE Circuits and Systems Magazine - Q3 2021 - Cover3
IEEE Circuits and Systems Magazine - Q3 2021 - Cover4
https://www.nxtbook.com/nxtbooks/ieee/circuitsandsystems_2023Q3
https://www.nxtbook.com/nxtbooks/ieee/circuitsandsystems_2023Q2
https://www.nxtbook.com/nxtbooks/ieee/circuitsandsystems_2023Q1
https://www.nxtbook.com/nxtbooks/ieee/circuitsandsystems_2022Q4
https://www.nxtbook.com/nxtbooks/ieee/circuitsandsystems_2022Q3
https://www.nxtbook.com/nxtbooks/ieee/circuitsandsystems_2022Q2
https://www.nxtbook.com/nxtbooks/ieee/circuitsandsystems_2022Q1
https://www.nxtbook.com/nxtbooks/ieee/circuitsandsystems_2021Q4
https://www.nxtbook.com/nxtbooks/ieee/circuitsandsystems_2021q3
https://www.nxtbook.com/nxtbooks/ieee/circuitsandsystems_2021q2
https://www.nxtbook.com/nxtbooks/ieee/circuitsandsystems_2021q1
https://www.nxtbook.com/nxtbooks/ieee/circuitsandsystems_2020q4
https://www.nxtbook.com/nxtbooks/ieee/circuitsandsystems_2020q3
https://www.nxtbook.com/nxtbooks/ieee/circuitsandsystems_2020q2
https://www.nxtbook.com/nxtbooks/ieee/circuitsandsystems_2020q1
https://www.nxtbook.com/nxtbooks/ieee/circuitsandsystems_2019q4
https://www.nxtbook.com/nxtbooks/ieee/circuitsandsystems_2019q3
https://www.nxtbook.com/nxtbooks/ieee/circuitsandsystems_2019q2
https://www.nxtbook.com/nxtbooks/ieee/circuitsandsystems_2019q1
https://www.nxtbook.com/nxtbooks/ieee/circuitsandsystems_2018q4
https://www.nxtbook.com/nxtbooks/ieee/circuitsandsystems_2018q3
https://www.nxtbook.com/nxtbooks/ieee/circuitsandsystems_2018q2
https://www.nxtbook.com/nxtbooks/ieee/circuitsandsystems_2018q1
https://www.nxtbookmedia.com