Content Gazette - August 2018 - 28
Contents
SPECIAL SECTION
Volume 35 | Number 4 | July 2018
COLUMNS
EXPLOITING STRUCTURE IN BIG
DATA ANALYTICS: SPARSE AND
LOW-RANK STRUCTURES
12
FROM THE GUEST EDITOR
14
HARNESSING STRUCTURES IN
BIG DATA VIA GUARANTEED LOWRANK MATRIX ESTIMATION
8
126
Namrata Vaswani
133
Yudong Chen and Yuejie Chi
32
56
ROBUST SUBSPACE LEARNING
Namrata Vaswani,
Thierry Bouwmans,
Sajid Javed, and
Praneeth Narayanamurthy
CORRELATION AWARENESS
IN LOW-RANK MODELS
Piya Pal
72
ON THE COVER
140
This issue of IEEE Signal Processing Magazine offers a
feature article cluster-or mini special issue-on exploiting structure in data analytics: low-rank and sparse structures. Two interesting feature articles on other topics are
also included. Enjoy the issue!
Reader's Choice
Top Downloads in IEEE Xplore
Lecture Notes
Closed-Form Impulse Responses
of Linear Time-Invariant Systems:
A Unifying Approach
Behnam Shahrrava
Tips & Tricks
On Hypothesis Testing for Comparing
Image Quality Assessment Metrics
Rui Zhu, Fei Zhou, Wenming Yang,
and Jing-Hao Xue
In the Spotlight
Automation Is Coming to Research
Pavel Loskot
COVER IMAGE: ©ISTOCKPHOTO.COM/KENTOH
THEORETICAL FOUNDATIONS
OF DEEP LEARNING VIA
SPARSE REPRESENTATIONS
Vardan Papyan, Yaniv Romano,
Jeremias Sulam, and Michael Elad
FEATURES
90
TRANSFORMING ENERGY
NETWORKS VIA PEER-TO-PEER
ENERGY TRADING
Assumption 1:
Independence
Between Residuals
dx and dy
IQA Metric
Mx
Residual dx
of Score x
IQA Database
IQA Metric
My
PG. 8
Maria S. Greco, Fulvio Gini,
Pietro Stinco, and Kristine Bell
YES
NO
Mx Is Significantly
Different from My?
(a)
Assumption 2:
Normality of
Residuals
dx and dy
IQA Metric
Mx
COGNITIVE RADARS:
ON THE ROAD TO REALITY
The F-Test
Residual dy
of Score y
Wayes Tushar, Chau Yuen,
Hamed Mohsenian-Rad,
Tapan Saha, H. Vincent Poor,
and Kristin L. Wood
112
Assumption 2:
Normality of
Residuals
dx and dy
Residual dx
of Score x
The Pitman
Test
IQA Database
IQA Metric
My
Residual dy
of Score y
YES
NO
Mx Is Significantly
Different from My?
(b)
PG. 133
IEEE SIGNAL PROCESSING MAGAZINE (ISSN 1053-5888) (ISPREG) is published bimonthly by the Institute of Electrical and Electronics Engineers, Inc., 3 Park Avenue, 17th Floor, New York,
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Printed in the U.S.A.
Digital Object Identifier 10.1109/MSP.2018.2833939
www.signalprocessingsociety.org [28] AUGUST 2018
IEEE
IEEESIGNAL
SIGNALPROCESSING
PROCESSINGMAGAZINE
MAGAZINE | | January
July 2018
2018 | |
1
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