IEEE Microwave Magazine - May 2017 - 187
MICROAPPS SCHEDULE
Wednesday, 7 June 2017
Room: Exhibition Floor, Booth 1946
Cardiff Model+ Investigating Bias and Frequency Interpolation using RAPID Behavioural Model Extraction
Vince Mallette, Focus Microwave Inc.
Tomorrow's Wireless: How 5G and the IoT is Shaping the Future of Wireless Technology
David Hall, National Instruments
Noise Figure Measurements for Multiport Applications
Volker Herrmann, Rohde & Schwarz USA, Inc.
Next Generation Small Form Factor Radio
Wyatt Taylor, Analog Devices, Inc.
RF Sampling Transceiver Drives Wide Bandwidth Communication and DPD Systems
Russell Hoppenstein, Texas Instruments
Integrated PIN Diode Switches Offer Improved Performance with Lower DC Power
Ray Baker, MACOM
The Future of RF Semiconductor Test
Panelists: Keysight Technologies/Cascade
Microtech, Inc., Rohde & Schwarz USA, Inc./
MPI Corp., National Instruments, Anritsu
Co., Qorvo, and Skyworks Solutions, Inc.,
Microwave Journal Panel Session
13:00
DAC Residual Phase Noise Measurements and Improvements Demonstrated Using Low Noise Regulators
Pete Delos, Jarrett Liner, Analog Devices, Inc.
13:20
A Novel Extended Drain NMOS Device for High Power Amplification in Commercial 300mm RFSOI Technology Luis ANDIA, GLOBALFOUNDRIES
Platform
13:40
WIPL-D Domain Decomposition Method: Fast and Accurate Simulation of Electrically Large Problems on
Desktop PCs
Branko Mrdakovic, WIPL-D
14:00
The Impact of New Spectrum on Design and Test
Roger Nichols, Keysight Technologies Keynote
14:40
Tunable and Fixed Filtering Solutions Enhances Dynamic Range and Flexibility of 4G-LTE Measurements:
Rafi Hershtig, K&L Microwave Inc.
15:00
Pushing Board-to-Board Interconnect Performance: Application-Specific Design
Don Bradfield, Southwest Microwave, Inc.
The Design of High Performance L-band GaN PAs Using Commercially Available Discrete Transistors
Andrew Dearn , Robert Smith, Stuart Glynn
and Liam Devlin; Plextek RFI Ltd., and Raj
Santhakumar, Richard Martin and Kim Tran;
Qorvo Inc, Plextek RFI
15:40
Improving Bias Filtering Rejection in Printed Wiring Board Designs
David Ignacio, Sunita Shah, Cobham Microelectronic Solutions
16:00
Highly Integrated Antenna Frontend Design for Radar, SATCOM and 5G
Winfried Simon, IMST GmbH
16:20
Using Very-Near-Field Scanners for Self-Interference Debugging in Communication Circuits
Dr. Arturo Mediano, Erkan T. Ickam, University
of Zaragoza, Spain+ EMSCAN
16:40
Overcoming High Power Limitation of Thin Film Resistors at GHz Frequencies Using CVD Diamond Substrates
Thomas Obeloer, Element Six (UK) Ltd
10:00
10:20
10:40
11:00
11:20
11:40
12:00
15:20
Technical Track Key:
May 2017
Cad and Simulation
Components and Systems
Test and Measurement
Materials and Packaging
Design
37
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Table of Contents for the Digital Edition of IEEE Microwave Magazine - May 2017
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IEEE Microwave Magazine - May 2017 - Cover3
IEEE Microwave Magazine - May 2017 - Cover4
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