IEEE Solid-States Circuits Magazine - Spring 2018 - 53

patterns that may have otherwise
deteriorated the perceived quality of
digitized audio and video communications. Subtractive dither means that
a dither signal is added to the input of
an ADC and subtracted from its output or vice versa [30]. It can be used
not only for its original purpose but
also to background calibrate ADCs.
Figure 15 shows a block diagram of an
early example [31]. It subtracts dither
from the input to a two-step ADC and
then adds the dither to the ADC output. Subtractive dither smooths out
the ADC transfer function, greatly
improving the differential nonlinearity and the spurious-free dynamic
range. However, if the dither is not
completely removed at the output,
the dither residue can degrade the
signal-to-noise ratio (SNR). For example, nonzero dither residue can result
from gain error in the dither DAC and/
or the ADC. To avoid this limitation,
the digital output can be correlated
with the dither and used to adjust
the gain of the dither DAC so that the
amplitude of the dither injected in
the analog domain is chosen to cancel
the dither at the output [32], [33]. A
disadvantage of this technique is that
it reduces the maximum allowed Vin
because the dither occupies some of
the input range of the ADC. To maintain the same SNR as in the case without dither, the input-referred noise
of the ADC must be reduced, which
significantly increases its power dissipation when the SNR is not limited
by quantization noise.

converted back to the digital domain
by ADC 2. The output of ADC 2 is
multiplied by the accumulator output, which weights the bits pro duced by the second stage relative
to those produced by the first stage
to compensate for interstage gain
G 1,
error. The weighting factor is 1/ \
\
G
where 1 is a digital estimate of
G 1. Since the dither was subtracted
in the analog domain, it is added in
the digital domain to the accumulator output. The accumulator operates in a negative feedback loop and
G 1, forcing it to converge to
adjusts \
G 1. The operation of this loop will
be described in detail in Part 2 of
this series. The key point here is
that when the dither is injected at
the output of the ADSC, the required
resolution of the DAC increases
because each output of the ADSC
without dither leads to two inputs
to the DAC, assuming the dither is
binary valued.

To avoid this problem, Figure 17
shows that the dither can be injected at
the ADSC input [35]. The beauty of this
technique is that its implementation
has low complexity because it does
not increase the required DAC resolution. However, a disadvantage of this
technique is that it only calibrates for
inputs near the comparator thresholds in the ADSC. Another disadvantage is that this technique reduces
the redundancy or correction range
because introducing the dither at the
ADSC input is equivalent to changing
the thresholds of the comparators in
the ADSC. A similar technique was
used to spread out interstage-gain
errors in the frequency domain but not
to calibrate these errors, improving
the spurious-free dynamic range but
not the SNR [36].
Also, a redundant residue mode
can be used to background calibrate
for interstage gain errors [37]. Figure 18 shows two plots of the amplified

∧

+

ADSC1
Vin

Accumulator

DAC1
−

×

+
Σ

SHA
+

1

×

RNG

Σ

µ

G1

Σ

+

Dout
+

+

1/G1

ADC2

Figure 16: A two-step ADC with subtractive dither injected at the output of ADSC 1 to background calibrate for error in G 1 .

Subtractive Dither to Background
Calibrate for Interstage Gain Errors
Also, subtractive dither can be used
to background calibrate for interstage gain errors. Figure 16 shows
a block diagram of one approach in
which the dither is injected at the
output of the ADSC [28]. A related
technique was independently developed [34]. In this case, the dither is
converted to the analog domain by
the same DAC that operates on the
ADSC output. Then the dither is subtracted from the held input, multiplied by the interstage gain G 1, and

Σ

+

Dout

×

DAC1

ADSC1
RNG
Vin

Dither
DAC −
SHA
1

+
×

Σ

+
∧

Accumulator

1/G1

×

−µ

Σ
+

−
+

Σ

G1

ADC2

Figure 17: A two-step ADC with subtractive dither injected at the input of ADSC 1 to background calibrate for error in G 1 .

IEEE SOLID-STATE CIRCUITS MAGAZINE

s p r I n g 2 0 18

53



Table of Contents for the Digital Edition of IEEE Solid-States Circuits Magazine - Spring 2018

Contents
IEEE Solid-States Circuits Magazine - Spring 2018 - Cover1
IEEE Solid-States Circuits Magazine - Spring 2018 - Cover2
IEEE Solid-States Circuits Magazine - Spring 2018 - Contents
IEEE Solid-States Circuits Magazine - Spring 2018 - 2
IEEE Solid-States Circuits Magazine - Spring 2018 - 3
IEEE Solid-States Circuits Magazine - Spring 2018 - 4
IEEE Solid-States Circuits Magazine - Spring 2018 - 5
IEEE Solid-States Circuits Magazine - Spring 2018 - 6
IEEE Solid-States Circuits Magazine - Spring 2018 - 7
IEEE Solid-States Circuits Magazine - Spring 2018 - 8
IEEE Solid-States Circuits Magazine - Spring 2018 - 9
IEEE Solid-States Circuits Magazine - Spring 2018 - 10
IEEE Solid-States Circuits Magazine - Spring 2018 - 11
IEEE Solid-States Circuits Magazine - Spring 2018 - 12
IEEE Solid-States Circuits Magazine - Spring 2018 - 13
IEEE Solid-States Circuits Magazine - Spring 2018 - 14
IEEE Solid-States Circuits Magazine - Spring 2018 - 15
IEEE Solid-States Circuits Magazine - Spring 2018 - 16
IEEE Solid-States Circuits Magazine - Spring 2018 - 17
IEEE Solid-States Circuits Magazine - Spring 2018 - 18
IEEE Solid-States Circuits Magazine - Spring 2018 - 19
IEEE Solid-States Circuits Magazine - Spring 2018 - 20
IEEE Solid-States Circuits Magazine - Spring 2018 - 21
IEEE Solid-States Circuits Magazine - Spring 2018 - 22
IEEE Solid-States Circuits Magazine - Spring 2018 - 23
IEEE Solid-States Circuits Magazine - Spring 2018 - 24
IEEE Solid-States Circuits Magazine - Spring 2018 - 25
IEEE Solid-States Circuits Magazine - Spring 2018 - 26
IEEE Solid-States Circuits Magazine - Spring 2018 - 27
IEEE Solid-States Circuits Magazine - Spring 2018 - 28
IEEE Solid-States Circuits Magazine - Spring 2018 - 29
IEEE Solid-States Circuits Magazine - Spring 2018 - 30
IEEE Solid-States Circuits Magazine - Spring 2018 - 31
IEEE Solid-States Circuits Magazine - Spring 2018 - 32
IEEE Solid-States Circuits Magazine - Spring 2018 - 33
IEEE Solid-States Circuits Magazine - Spring 2018 - 34
IEEE Solid-States Circuits Magazine - Spring 2018 - 35
IEEE Solid-States Circuits Magazine - Spring 2018 - 36
IEEE Solid-States Circuits Magazine - Spring 2018 - 37
IEEE Solid-States Circuits Magazine - Spring 2018 - 38
IEEE Solid-States Circuits Magazine - Spring 2018 - 39
IEEE Solid-States Circuits Magazine - Spring 2018 - 40
IEEE Solid-States Circuits Magazine - Spring 2018 - 41
IEEE Solid-States Circuits Magazine - Spring 2018 - 42
IEEE Solid-States Circuits Magazine - Spring 2018 - 43
IEEE Solid-States Circuits Magazine - Spring 2018 - 44
IEEE Solid-States Circuits Magazine - Spring 2018 - 45
IEEE Solid-States Circuits Magazine - Spring 2018 - 46
IEEE Solid-States Circuits Magazine - Spring 2018 - 47
IEEE Solid-States Circuits Magazine - Spring 2018 - 48
IEEE Solid-States Circuits Magazine - Spring 2018 - 49
IEEE Solid-States Circuits Magazine - Spring 2018 - 50
IEEE Solid-States Circuits Magazine - Spring 2018 - 51
IEEE Solid-States Circuits Magazine - Spring 2018 - 52
IEEE Solid-States Circuits Magazine - Spring 2018 - 53
IEEE Solid-States Circuits Magazine - Spring 2018 - 54
IEEE Solid-States Circuits Magazine - Spring 2018 - 55
IEEE Solid-States Circuits Magazine - Spring 2018 - 56
IEEE Solid-States Circuits Magazine - Spring 2018 - 57
IEEE Solid-States Circuits Magazine - Spring 2018 - 58
IEEE Solid-States Circuits Magazine - Spring 2018 - 59
IEEE Solid-States Circuits Magazine - Spring 2018 - 60
IEEE Solid-States Circuits Magazine - Spring 2018 - 61
IEEE Solid-States Circuits Magazine - Spring 2018 - 62
IEEE Solid-States Circuits Magazine - Spring 2018 - 63
IEEE Solid-States Circuits Magazine - Spring 2018 - 64
IEEE Solid-States Circuits Magazine - Spring 2018 - 65
IEEE Solid-States Circuits Magazine - Spring 2018 - 66
IEEE Solid-States Circuits Magazine - Spring 2018 - 67
IEEE Solid-States Circuits Magazine - Spring 2018 - 68
IEEE Solid-States Circuits Magazine - Spring 2018 - 69
IEEE Solid-States Circuits Magazine - Spring 2018 - 70
IEEE Solid-States Circuits Magazine - Spring 2018 - 71
IEEE Solid-States Circuits Magazine - Spring 2018 - 72
IEEE Solid-States Circuits Magazine - Spring 2018 - 73
IEEE Solid-States Circuits Magazine - Spring 2018 - 74
IEEE Solid-States Circuits Magazine - Spring 2018 - 75
IEEE Solid-States Circuits Magazine - Spring 2018 - 76
IEEE Solid-States Circuits Magazine - Spring 2018 - 77
IEEE Solid-States Circuits Magazine - Spring 2018 - 78
IEEE Solid-States Circuits Magazine - Spring 2018 - 79
IEEE Solid-States Circuits Magazine - Spring 2018 - 80
IEEE Solid-States Circuits Magazine - Spring 2018 - 81
IEEE Solid-States Circuits Magazine - Spring 2018 - 82
IEEE Solid-States Circuits Magazine - Spring 2018 - 83
IEEE Solid-States Circuits Magazine - Spring 2018 - 84
IEEE Solid-States Circuits Magazine - Spring 2018 - 85
IEEE Solid-States Circuits Magazine - Spring 2018 - 86
IEEE Solid-States Circuits Magazine - Spring 2018 - 87
IEEE Solid-States Circuits Magazine - Spring 2018 - 88
IEEE Solid-States Circuits Magazine - Spring 2018 - 89
IEEE Solid-States Circuits Magazine - Spring 2018 - 90
IEEE Solid-States Circuits Magazine - Spring 2018 - 91
IEEE Solid-States Circuits Magazine - Spring 2018 - 92
IEEE Solid-States Circuits Magazine - Spring 2018 - 93
IEEE Solid-States Circuits Magazine - Spring 2018 - 94
IEEE Solid-States Circuits Magazine - Spring 2018 - 95
IEEE Solid-States Circuits Magazine - Spring 2018 - 96
IEEE Solid-States Circuits Magazine - Spring 2018 - 97
IEEE Solid-States Circuits Magazine - Spring 2018 - 98
IEEE Solid-States Circuits Magazine - Spring 2018 - 99
IEEE Solid-States Circuits Magazine - Spring 2018 - 100
IEEE Solid-States Circuits Magazine - Spring 2018 - 101
IEEE Solid-States Circuits Magazine - Spring 2018 - 102
IEEE Solid-States Circuits Magazine - Spring 2018 - 103
IEEE Solid-States Circuits Magazine - Spring 2018 - 104
IEEE Solid-States Circuits Magazine - Spring 2018 - 105
IEEE Solid-States Circuits Magazine - Spring 2018 - 106
IEEE Solid-States Circuits Magazine - Spring 2018 - 107
IEEE Solid-States Circuits Magazine - Spring 2018 - 108
IEEE Solid-States Circuits Magazine - Spring 2018 - 109
IEEE Solid-States Circuits Magazine - Spring 2018 - 110
IEEE Solid-States Circuits Magazine - Spring 2018 - 111
IEEE Solid-States Circuits Magazine - Spring 2018 - 112
IEEE Solid-States Circuits Magazine - Spring 2018 - 113
IEEE Solid-States Circuits Magazine - Spring 2018 - 114
IEEE Solid-States Circuits Magazine - Spring 2018 - 115
IEEE Solid-States Circuits Magazine - Spring 2018 - 116
IEEE Solid-States Circuits Magazine - Spring 2018 - 117
IEEE Solid-States Circuits Magazine - Spring 2018 - 118
IEEE Solid-States Circuits Magazine - Spring 2018 - 119
IEEE Solid-States Circuits Magazine - Spring 2018 - 120
IEEE Solid-States Circuits Magazine - Spring 2018 - 121
IEEE Solid-States Circuits Magazine - Spring 2018 - 122
IEEE Solid-States Circuits Magazine - Spring 2018 - 123
IEEE Solid-States Circuits Magazine - Spring 2018 - 124
IEEE Solid-States Circuits Magazine - Spring 2018 - Cover3
IEEE Solid-States Circuits Magazine - Spring 2018 - Cover4
https://www.nxtbook.com/nxtbooks/ieee/mssc_fall2023
https://www.nxtbook.com/nxtbooks/ieee/mssc_summer2023
https://www.nxtbook.com/nxtbooks/ieee/mssc_spring2023
https://www.nxtbook.com/nxtbooks/ieee/mssc_winter2023
https://www.nxtbook.com/nxtbooks/ieee/mssc_fall2022
https://www.nxtbook.com/nxtbooks/ieee/mssc_summer2022
https://www.nxtbook.com/nxtbooks/ieee/mssc_spring2022
https://www.nxtbook.com/nxtbooks/ieee/mssc_winter2022
https://www.nxtbook.com/nxtbooks/ieee/mssc_fall2021
https://www.nxtbook.com/nxtbooks/ieee/mssc_summer2021
https://www.nxtbook.com/nxtbooks/ieee/mssc_spring2021
https://www.nxtbook.com/nxtbooks/ieee/mssc_winter2021
https://www.nxtbook.com/nxtbooks/ieee/mssc_fall2020
https://www.nxtbook.com/nxtbooks/ieee/mssc_summer2020
https://www.nxtbook.com/nxtbooks/ieee/mssc_spring2020
https://www.nxtbook.com/nxtbooks/ieee/mssc_winter2020
https://www.nxtbook.com/nxtbooks/ieee/mssc_fall2019
https://www.nxtbook.com/nxtbooks/ieee/mssc_summer2019
https://www.nxtbook.com/nxtbooks/ieee/mssc_2019summer
https://www.nxtbook.com/nxtbooks/ieee/mssc_2019winter
https://www.nxtbook.com/nxtbooks/ieee/mssc_2018fall
https://www.nxtbook.com/nxtbooks/ieee/mssc_2018summer
https://www.nxtbook.com/nxtbooks/ieee/mssc_2018spring
https://www.nxtbook.com/nxtbooks/ieee/mssc_2018winter
https://www.nxtbook.com/nxtbooks/ieee/solidstatecircuits_winter2017
https://www.nxtbook.com/nxtbooks/ieee/solidstatecircuits_fall2017
https://www.nxtbook.com/nxtbooks/ieee/solidstatecircuits_summer2017
https://www.nxtbook.com/nxtbooks/ieee/solidstatecircuits_spring2017
https://www.nxtbook.com/nxtbooks/ieee/solidstatecircuits_winter2016
https://www.nxtbook.com/nxtbooks/ieee/solidstatecircuits_fall2016
https://www.nxtbook.com/nxtbooks/ieee/solidstatecircuits_summer2016
https://www.nxtbook.com/nxtbooks/ieee/solidstatecircuits_spring2016
https://www.nxtbook.com/nxtbooks/ieee/solidstatecircuits_winter2015
https://www.nxtbook.com/nxtbooks/ieee/solidstatecircuits_fall2015
https://www.nxtbook.com/nxtbooks/ieee/solidstatecircuits_summer2015
https://www.nxtbook.com/nxtbooks/ieee/solidstatecircuits_spring2015
https://www.nxtbook.com/nxtbooks/ieee/solidstatecircuits_winter2014
https://www.nxtbook.com/nxtbooks/ieee/solidstatecircuits_fall2014
https://www.nxtbook.com/nxtbooks/ieee/solidstatecircuits_summer2014
https://www.nxtbook.com/nxtbooks/ieee/solidstatecircuits_spring2014
https://www.nxtbookmedia.com