IEEE Solid-States Circuits Magazine - Summer 2018 - 16
Keith A. Bowman
Adaptive and
Resilient Circuits
A tutorial on improving processor
performance, energy efficiency, and
yield via dynamic variation tolerance
V
ariability in device, circuit, and system parameters is one
of the primary challenges in the semiconductor industry.
Parameter variations degrade processor performance, energy efficiency, and yield across all market segments, ranging from small embedded cores in systems on chip to large
multicore servers. In the design, manufacturing, and testing of commercial
processors, there are three major variability classifications: 1) simulation
tool uncertainties, 2) static parameter variations, and 3) dynamic parameter
variations. Simulation tool uncertainties result from a design tradeoff between the simulation time and accuracy for both static-timing analysis and
circuit simulators. In addition, transistor and interconnect model inaccuracies increase simulation tool uncertainties, especially when designing a processor in a new technology.
Static parameter variations occur during the manufacturing process.
Although manufacturing-induced parameter variations change from die to die,
these parameter variations are static per die. A dynamic parameter variation
occurs in time during the processor operation as environmental and workload
conditions change. Examples of dynamic parameter variations include supply voltage VDD droops, temperature changes, transistor aging, and processor
power variations due to workload fluctuations. A distinguishing feature of a
dynamic parameter variation is the time scale in which the parameter changes.
An example of a slow-changing variation is a temperature fluctuation with a
time scale of ~100 μs to 1 ms. A high-frequency VDD droop with a time scale of
~2 ns is an example of a fast-changing variation.
Digital Object Identifier 10.1109/MSSC.2018.2844601
Date of publication: 13 August 2018
16
su m m e r 2 0 18
IEEE SOLID-STATE CIRCUITS MAGAZINE
1943-0582/18©2018IEEE
1943-0582/18©2018Ieee
IEEE Solid-States Circuits Magazine - Summer 2018
Table of Contents for the Digital Edition of IEEE Solid-States Circuits Magazine - Summer 2018
Contents
IEEE Solid-States Circuits Magazine - Summer 2018 - Cover1
IEEE Solid-States Circuits Magazine - Summer 2018 - Cover2
IEEE Solid-States Circuits Magazine - Summer 2018 - Contents
IEEE Solid-States Circuits Magazine - Summer 2018 - 2
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