IEEE Solid-States Circuits Magazine - Summer 2018 - 37

key ADC circuits in the context of a timeinterleaved SAR ADC. Note that many of
the circuit concepts are also relevant to
other ADC topologies.

Key ADC Circuits
Figure 4 shows a block diagram of a
32-way time-interleaved SAR ADC. The
interleaving of the 32-unit ADCs is done

in two stages due to the challenges in
generating low-jitter and low-skew clock
phases, with typical first-line interleaving factors chosen between four and 16.
After the AFE, which often includes a
continuous-time linear equalizer (CTLE)
and variable-gain amplifier (VGA), there
is a bank of eight first-line track-andhold (T/H) switches that sequentially

Digital FFE
Z -1

0.15

0.1
0.05

α1

Output PDF

Z -1
fQ,FFE (q)

Input PDF
0.15
fQ (q)

sample the ADC input signal at timing
offsets equal to the Nyquist-rate sampling period. Each sampled T/H output
is then buffered to drive a bank of fourunit ADCs that perform a sequential
second-line sampling operation and bit
conversion at a rate equal to the overall
ADC sampling rate divided by the interleave factor.

α2

α3

0.05
0
-10 -6 -2 2 6 10
Quantization Noise (mV)

0
-10 -6 -2 2 6 10
Quantization Noise (mV)
Quantization Noise
PDF
0.8
0.6
0.4
0.2
0
-10 -6 -2 2
6
10
Quantization Noise (mV)

0.8
1/α3 fQ (q/α3)t

0.8
1/α2 fQ (q/α2)

1/α1 fQ (q/α1)

0.1

0.6
0.4
0.2
0
-10

0.6
0.4
0.2
0
-10 -6 -2 2
6
10
Quantization Noise (mV)

-6 -2 2
6
10
Quantization Noise (mV)
Scaled Noise PDFs

Key Simulator Settings
* Three-Tap Tx with One-Vpp Swing
* CTLE/VGA Front End with 7.4-dB Peaking and 16-GHz BW
* 400-mV ADC FSR
* Digital 14-Tap FFE and One-Tap DFE
* 3-mVrms ADC Input Noise
* RJ = 300 fsrms

(b)

0

37.2-dB Channel

-2

0

-4 ADC ENOB
2
-6
3
Statistically
4
-8
5
Combined
6
PAM-4
-10
7
Voltage Margin
8
-12
-60 -40 -20 0 20 40 60
Voltage Margin (mV)

9.4-dB Channel

-2

FEC Target
BER (log10)

0
-5
-10
-15
-20
-25
-30 14 GHz Loss
9.4-dB
-35
37.2-dB
-40
-45
0 2 4 6 8 10 12 14 16
Frequency (GHz)

BER (log10)

S21 (dB)

(a)

FEC Target
-4 ADC ENOB
2
-6
3
4
-8
5
6
-10
7
8
-12
-60 -40 -20 0 20 40 60
Voltage Margin (mV)

(c)

(d)

Figure 2: (a) The modeling of quantization noise amplification through a digital FFE. (b) The frequency response of two electrical printed
circuit board channels. A comparison of 56-Gb/s PAM-4 voltage bathtub curves with varying ADC ENOB for the (c) 37.2-dB loss channel and
(d) 9.4-dB loss channel. BW: bandwidth; RJ: random jitter.

IEEE SOLID-STATE CIRCUITS MAGAZINE

su m m E r 2 0 18

37



IEEE Solid-States Circuits Magazine - Summer 2018

Table of Contents for the Digital Edition of IEEE Solid-States Circuits Magazine - Summer 2018

Contents
IEEE Solid-States Circuits Magazine - Summer 2018 - Cover1
IEEE Solid-States Circuits Magazine - Summer 2018 - Cover2
IEEE Solid-States Circuits Magazine - Summer 2018 - Contents
IEEE Solid-States Circuits Magazine - Summer 2018 - 2
IEEE Solid-States Circuits Magazine - Summer 2018 - 3
IEEE Solid-States Circuits Magazine - Summer 2018 - 4
IEEE Solid-States Circuits Magazine - Summer 2018 - 5
IEEE Solid-States Circuits Magazine - Summer 2018 - 6
IEEE Solid-States Circuits Magazine - Summer 2018 - 7
IEEE Solid-States Circuits Magazine - Summer 2018 - 8
IEEE Solid-States Circuits Magazine - Summer 2018 - 9
IEEE Solid-States Circuits Magazine - Summer 2018 - 10
IEEE Solid-States Circuits Magazine - Summer 2018 - 11
IEEE Solid-States Circuits Magazine - Summer 2018 - 12
IEEE Solid-States Circuits Magazine - Summer 2018 - 13
IEEE Solid-States Circuits Magazine - Summer 2018 - 14
IEEE Solid-States Circuits Magazine - Summer 2018 - 15
IEEE Solid-States Circuits Magazine - Summer 2018 - 16
IEEE Solid-States Circuits Magazine - Summer 2018 - 17
IEEE Solid-States Circuits Magazine - Summer 2018 - 18
IEEE Solid-States Circuits Magazine - Summer 2018 - 19
IEEE Solid-States Circuits Magazine - Summer 2018 - 20
IEEE Solid-States Circuits Magazine - Summer 2018 - 21
IEEE Solid-States Circuits Magazine - Summer 2018 - 22
IEEE Solid-States Circuits Magazine - Summer 2018 - 23
IEEE Solid-States Circuits Magazine - Summer 2018 - 24
IEEE Solid-States Circuits Magazine - Summer 2018 - 25
IEEE Solid-States Circuits Magazine - Summer 2018 - 26
IEEE Solid-States Circuits Magazine - Summer 2018 - 27
IEEE Solid-States Circuits Magazine - Summer 2018 - 28
IEEE Solid-States Circuits Magazine - Summer 2018 - 29
IEEE Solid-States Circuits Magazine - Summer 2018 - 30
IEEE Solid-States Circuits Magazine - Summer 2018 - 31
IEEE Solid-States Circuits Magazine - Summer 2018 - 32
IEEE Solid-States Circuits Magazine - Summer 2018 - 33
IEEE Solid-States Circuits Magazine - Summer 2018 - 34
IEEE Solid-States Circuits Magazine - Summer 2018 - 35
IEEE Solid-States Circuits Magazine - Summer 2018 - 36
IEEE Solid-States Circuits Magazine - Summer 2018 - 37
IEEE Solid-States Circuits Magazine - Summer 2018 - 38
IEEE Solid-States Circuits Magazine - Summer 2018 - 39
IEEE Solid-States Circuits Magazine - Summer 2018 - 40
IEEE Solid-States Circuits Magazine - Summer 2018 - 41
IEEE Solid-States Circuits Magazine - Summer 2018 - 42
IEEE Solid-States Circuits Magazine - Summer 2018 - 43
IEEE Solid-States Circuits Magazine - Summer 2018 - 44
IEEE Solid-States Circuits Magazine - Summer 2018 - 45
IEEE Solid-States Circuits Magazine - Summer 2018 - 46
IEEE Solid-States Circuits Magazine - Summer 2018 - 47
IEEE Solid-States Circuits Magazine - Summer 2018 - 48
IEEE Solid-States Circuits Magazine - Summer 2018 - 49
IEEE Solid-States Circuits Magazine - Summer 2018 - 50
IEEE Solid-States Circuits Magazine - Summer 2018 - 51
IEEE Solid-States Circuits Magazine - Summer 2018 - 52
IEEE Solid-States Circuits Magazine - Summer 2018 - 53
IEEE Solid-States Circuits Magazine - Summer 2018 - 54
IEEE Solid-States Circuits Magazine - Summer 2018 - 55
IEEE Solid-States Circuits Magazine - Summer 2018 - 56
IEEE Solid-States Circuits Magazine - Summer 2018 - 57
IEEE Solid-States Circuits Magazine - Summer 2018 - 58
IEEE Solid-States Circuits Magazine - Summer 2018 - 59
IEEE Solid-States Circuits Magazine - Summer 2018 - 60
IEEE Solid-States Circuits Magazine - Summer 2018 - 61
IEEE Solid-States Circuits Magazine - Summer 2018 - 62
IEEE Solid-States Circuits Magazine - Summer 2018 - 63
IEEE Solid-States Circuits Magazine - Summer 2018 - 64
IEEE Solid-States Circuits Magazine - Summer 2018 - 65
IEEE Solid-States Circuits Magazine - Summer 2018 - 66
IEEE Solid-States Circuits Magazine - Summer 2018 - 67
IEEE Solid-States Circuits Magazine - Summer 2018 - 68
IEEE Solid-States Circuits Magazine - Summer 2018 - 69
IEEE Solid-States Circuits Magazine - Summer 2018 - 70
IEEE Solid-States Circuits Magazine - Summer 2018 - 71
IEEE Solid-States Circuits Magazine - Summer 2018 - 72
IEEE Solid-States Circuits Magazine - Summer 2018 - 73
IEEE Solid-States Circuits Magazine - Summer 2018 - 74
IEEE Solid-States Circuits Magazine - Summer 2018 - 75
IEEE Solid-States Circuits Magazine - Summer 2018 - 76
IEEE Solid-States Circuits Magazine - Summer 2018 - 77
IEEE Solid-States Circuits Magazine - Summer 2018 - 78
IEEE Solid-States Circuits Magazine - Summer 2018 - 79
IEEE Solid-States Circuits Magazine - Summer 2018 - 80
IEEE Solid-States Circuits Magazine - Summer 2018 - 81
IEEE Solid-States Circuits Magazine - Summer 2018 - 82
IEEE Solid-States Circuits Magazine - Summer 2018 - 83
IEEE Solid-States Circuits Magazine - Summer 2018 - 84
IEEE Solid-States Circuits Magazine - Summer 2018 - 85
IEEE Solid-States Circuits Magazine - Summer 2018 - 86
IEEE Solid-States Circuits Magazine - Summer 2018 - 87
IEEE Solid-States Circuits Magazine - Summer 2018 - 88
IEEE Solid-States Circuits Magazine - Summer 2018 - 89
IEEE Solid-States Circuits Magazine - Summer 2018 - 90
IEEE Solid-States Circuits Magazine - Summer 2018 - 91
IEEE Solid-States Circuits Magazine - Summer 2018 - 92
IEEE Solid-States Circuits Magazine - Summer 2018 - 93
IEEE Solid-States Circuits Magazine - Summer 2018 - 94
IEEE Solid-States Circuits Magazine - Summer 2018 - 95
IEEE Solid-States Circuits Magazine - Summer 2018 - 96
IEEE Solid-States Circuits Magazine - Summer 2018 - 97
IEEE Solid-States Circuits Magazine - Summer 2018 - 98
IEEE Solid-States Circuits Magazine - Summer 2018 - 99
IEEE Solid-States Circuits Magazine - Summer 2018 - 100
IEEE Solid-States Circuits Magazine - Summer 2018 - 101
IEEE Solid-States Circuits Magazine - Summer 2018 - 102
IEEE Solid-States Circuits Magazine - Summer 2018 - 103
IEEE Solid-States Circuits Magazine - Summer 2018 - 104
IEEE Solid-States Circuits Magazine - Summer 2018 - 105
IEEE Solid-States Circuits Magazine - Summer 2018 - 106
IEEE Solid-States Circuits Magazine - Summer 2018 - 107
IEEE Solid-States Circuits Magazine - Summer 2018 - 108
IEEE Solid-States Circuits Magazine - Summer 2018 - Cover3
IEEE Solid-States Circuits Magazine - Summer 2018 - Cover4
https://www.nxtbook.com/nxtbooks/ieee/mssc_fall2023
https://www.nxtbook.com/nxtbooks/ieee/mssc_summer2023
https://www.nxtbook.com/nxtbooks/ieee/mssc_spring2023
https://www.nxtbook.com/nxtbooks/ieee/mssc_winter2023
https://www.nxtbook.com/nxtbooks/ieee/mssc_fall2022
https://www.nxtbook.com/nxtbooks/ieee/mssc_summer2022
https://www.nxtbook.com/nxtbooks/ieee/mssc_spring2022
https://www.nxtbook.com/nxtbooks/ieee/mssc_winter2022
https://www.nxtbook.com/nxtbooks/ieee/mssc_fall2021
https://www.nxtbook.com/nxtbooks/ieee/mssc_summer2021
https://www.nxtbook.com/nxtbooks/ieee/mssc_spring2021
https://www.nxtbook.com/nxtbooks/ieee/mssc_winter2021
https://www.nxtbook.com/nxtbooks/ieee/mssc_fall2020
https://www.nxtbook.com/nxtbooks/ieee/mssc_summer2020
https://www.nxtbook.com/nxtbooks/ieee/mssc_spring2020
https://www.nxtbook.com/nxtbooks/ieee/mssc_winter2020
https://www.nxtbook.com/nxtbooks/ieee/mssc_fall2019
https://www.nxtbook.com/nxtbooks/ieee/mssc_summer2019
https://www.nxtbook.com/nxtbooks/ieee/mssc_2019summer
https://www.nxtbook.com/nxtbooks/ieee/mssc_2019winter
https://www.nxtbook.com/nxtbooks/ieee/mssc_2018fall
https://www.nxtbook.com/nxtbooks/ieee/mssc_2018summer
https://www.nxtbook.com/nxtbooks/ieee/mssc_2018spring
https://www.nxtbook.com/nxtbooks/ieee/mssc_2018winter
https://www.nxtbook.com/nxtbooks/ieee/solidstatecircuits_winter2017
https://www.nxtbook.com/nxtbooks/ieee/solidstatecircuits_fall2017
https://www.nxtbook.com/nxtbooks/ieee/solidstatecircuits_summer2017
https://www.nxtbook.com/nxtbooks/ieee/solidstatecircuits_spring2017
https://www.nxtbook.com/nxtbooks/ieee/solidstatecircuits_winter2016
https://www.nxtbook.com/nxtbooks/ieee/solidstatecircuits_fall2016
https://www.nxtbook.com/nxtbooks/ieee/solidstatecircuits_summer2016
https://www.nxtbook.com/nxtbooks/ieee/solidstatecircuits_spring2016
https://www.nxtbook.com/nxtbooks/ieee/solidstatecircuits_winter2015
https://www.nxtbook.com/nxtbooks/ieee/solidstatecircuits_fall2015
https://www.nxtbook.com/nxtbooks/ieee/solidstatecircuits_summer2015
https://www.nxtbook.com/nxtbooks/ieee/solidstatecircuits_spring2015
https://www.nxtbook.com/nxtbooks/ieee/solidstatecircuits_winter2014
https://www.nxtbook.com/nxtbooks/ieee/solidstatecircuits_fall2014
https://www.nxtbook.com/nxtbooks/ieee/solidstatecircuits_summer2014
https://www.nxtbook.com/nxtbooks/ieee/solidstatecircuits_spring2014
https://www.nxtbookmedia.com