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About the Authors
Youngcheol Chae (ychae@yonsei.
ac.kr) received his B.S., M.S., and
Ph.D. degrees from Yonsei University,
Seoul, South Korea, in 2003, 2005,
and 2009, respectively. During his
Ph.D. studies, he advanced oversampling
data converters through
innovative design techniques, including
inverter-based amplifiers. From
2009 to 2011, he was a postdoctoral
IEEE SOLID-STATE CIRCUITS MAGAZINE
SUMMER 2023
51
http://dx.doi.org/10.1016/0250-6874(89)87018-0 http://dx.doi.org/10.1016/0250-6874(89)87018-0 http://dx.doi.org/10.1109/4.585245 http://dx.doi.org/10.1109/4.90025 https://github.com/bmurmann/ADC-survey https://github.com/bmurmann/ADC-survey https://ei.ewi.tudelft.nl/docs/TSensor_survey.xls https://ei.ewi.tudelft.nl/docs/TSensor_survey.xls https://converterpassion.wordpress.com/2012/08/26/adc-performance-evolution-thermal-figure-of-merit-fom/ https://converterpassion.wordpress.com/2012/08/26/adc-performance-evolution-thermal-figure-of-merit-fom/ https://converterpassion.wordpress.com/2012/08/26/adc-performance-evolution-thermal-figure-of-merit-fom/ http://dx.doi.org/10.1049/el:19810304 http://dx.doi.org/10.1109/JSSC.2008.2010973 http://dx.doi.org/10.1161/01.CIR.97.19.1978 http://dx.doi.org/10.1109/TBME.1970.4502738 http://dx.doi.org/10.1109/JSSC.2012.2217865 http://dx.doi.org/10.1109/RBME.2017.2656388 http://dx.doi.org/10.1109/4.772414 http://dx.doi.org/10.1109/TBME.1983.325168 http://dx.doi.org/10.1109/MSSC.2019.2939338 http://dx.doi.org/10.1109/IRET-SET.1962.5008839 http://dx.doi.org/10.1109/MSSC.2019.2939338 http://dx.doi.org/10.1109/IRET-SET.1962.5008839 http://dx.doi.org/10.1109/TBCAS.2019.2942450 http://dx.doi.org/10.1109/TBCAS.2019.2942450 http://dx.doi.org/10.1109/JSSC.2003.811979 http://dx.doi.org/10.1109/JSSC.1978.1052044 http://dx.doi.org/10.1109/JSSC.1978.1052044 http://dx.doi.org/10.1007/s11517-015-1431-3 http://dx.doi.org/10.1109/JSSC.1980.1051512 http://dx.doi.org/10.1109/JSSC.1976.1050820 https://stevenson.lab.uconn.edu/scaling/ https://stevenson.lab.uconn.edu/scaling/ http://dx.doi.org/10.1109/JSSC.1978.1051084 http://dx.doi.org/10.1109/JSSC.1978.1051084 http://dx.doi.org/10.1109/4.890300 http://dx.doi.org/10.1109/JSSC.2011.2162923 http://dx.doi.org/10.1109/JSSC.2011.2162923 http://dx.doi.org/10.1109/JSSC.2003.819167

IEEE Solid-States Circuits Magazine - Summer 2023

Table of Contents for the Digital Edition of IEEE Solid-States Circuits Magazine - Summer 2023

Contents
IEEE Solid-States Circuits Magazine - Summer 2023 - Cover1
IEEE Solid-States Circuits Magazine - Summer 2023 - Cover2
IEEE Solid-States Circuits Magazine - Summer 2023 - Contents
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