IEEE Solid-States Circuits Magazine - Summer 2023 - 86
implementation of robust carbon
metrics and a design framework that
encompasses the entire life cycle of
cloud computing. By quantifying and
optimizing the embodied carbon
emissions along with the operational
energy consumption, it becomes
possible to make informed decisions
regarding hardware design, energy
efficiency, and the adoption of renewable
energy sources.
In addition to environmental impact,
sustainable practices should
also encompass social and economic
impact. The semiconductor industry
must prioritize employee well-being
by ensuring a safe and healthy
work environment, offering flexible
work arrangements, and supporting
mental health and well-being initiatives.
As the industry continues to
evolve and change over the next 75
years, it is important to note that a
new generation of researchers and
engineers with a heightened awareness
of the impact of their work on
both the environment and society
will emerge. It is essential for the industry
to embrace and support this
new generation.
Overall, the next decades will be a
critical period for the semiconductor
industry to prioritize sustainability
in all aspects of its operations.
Conclusions
The next 75 years of IC technologies
will be characterized by a range of
challenges and opportunities. While
the traditional Moore's law road map
may no longer be valid, the industry
is entering an exciting new phase of
innovation and growth. To succeed
in this environment, designers will
need to be familiar with a range of
different technologies and fields,
from materials science and device
physics to computer science and AI.
They will need to be able to collaborate
effectively with experts from
these fields as well as understand
the various tradeoffs that exist between
different technologies and
design choices. With the right mindset
and skill set, designers can help
86 SUMMER 2023
to shape the future of semiconductor
technologies, creating products
that are not only technically sound
but also socially responsible and environmentally
sustainable.
Acknowledgment
The author would like to thank S. Samavedam,
J. Ryckaert, J. Myers, G.
Hellings, N. Horiguchi, and G. Sankar
Kar for their invaluable insights and
constructive discussions. The author
would also like to express gratitude
to the partner companies that support
the Imec industrial affiliation
programs and to all the diligent researchers
at Imec whose work has contributed
to this article.
References
[1] D. Hisamoto et al., " A folded-channel MOSFET
for deep-sub-tenth micron era, " in
Proc. Int. Electron Devices Meeting (IEDM),
Tech. Dig. (Cat. No.98CH36217), 1998,
pp. 1032-1034, doi: 10.1109/IEDM.1998.
746531.
[2] J. Kavalieros et al., " Tri-gate transistor
architecture with high-k gate dielectrics,
metal gates and strain engineering, " in
Proc. Symp. VLSI Technol., Dig. Tech. Papers,
2006, pp. 50-51, doi: 10.1109/VLSIT.2006.1705211.
[3]
A. Chatterjee et al., " CMOS metal replacement
gate transistors using tantalum
pentoxide gate
Electron Devices Meeting, Tech. Dig. (Cat.
No.98CH36217), 1998, pp. 777-780, doi:
10.1109/IEDM.1998.746471.
[4] S. N. Ong et al., " A 22nm FDSOI technology
optimized for RF/mmWave applications, "
in
Proc.
IEEE Radio Freq.
Integr.
Circuits Symp. (RFIC), 2018, pp. 72-75, doi:
10.1109/RFIC.2018.8429035.
[5] J. Ryckaert et al., " The complementary FET
(CFET) for CMOS scaling beyond N3, " in Proc.
IEEE Symp. VLSI Technol., 2018, pp. 141-
142, doi: 10.1109/VLSIT.2018.8510618.
[6] N. Horiguchi and J. Ryckaert. " Integrating
CFET into the logic technology roadmap
beyond 1 nm. " Embedded. Accessed: Aug.
1, 2022. [Online]. Available: https://www.
embedded.com/integrating-cfet-into-the
-logic-technology-roadmap-beyond-1-nm/
[7] S. B. Samavedam et al., " Future logic
scaling: Towards atomic channels and
deconstructed chips, " in Proc. IEEE Int.
Electron Devices Meeting (IEDM), 2020, pp.
1.1.1-1.1.10, doi: 10.1109/IEDM13553.2020.
9372023.
[8] Y.-Y. Chung et al., " First demonstration
of GAA monolayer-MoS2 nanosheet nFET
with 410μA μ m ID 1V VD at 40nm gate
length, " in Proc. Int. Electron Devices Meeting
(IEDM), 2022, pp. 34.5.1-34.5.4, doi:
10.1109/IEDM45625.2022.10019563.
[9] J. Van Campenhout,
" Silicon photonics
technology for terabit-scale optical I/O, "
in Proc. ACM/IEEE Int. Workshop Syst. Level
Interconnect Prediction (SLIP), 2021, p. 41,
doi: 10.1109/SLIP52707.2021.00015.
[10] S. Clima et al., " Dielectric response in ferroelectrics
near polarization switching:
insulator, " in Proc. Int.
Analytical calculations, first-principles
modeling, and experimental verification, "
IEEE Trans. Electron Devices, vol. 69, no.
9, pp. 5345-5350, Sep. 2022, doi: 10.1109/
TED.2022.3194822.
[11] E. Beyne, " The 3-D interconnect technology
landscape, " IEEE Des. Test, vol. 33,
no. 3, pp. 8-20, Jun. 2016, doi: 10.1109/
MDAT.2016.2544837.
[12] E. Beyne, " Heterogeneous
system partitioning
and the 3D interconnect technology
landscape, " in Proc. Symp. VLSI
Technol. Circuits, Short Course SC2-2,
2020.
[13] S. Khushu and W. Gomes, " Lakefield: Hybrid
cores in 3D package, " in Proc. IEEE
Hot Chips 31 Symp. (HCS), 2019, pp. 1-20,
doi: 10.1109/HOTCHIPS.2019.8875641.
[14] " Unlocking system-scaling bottlenecks
with STCO, " interview Julien Ryckaert.
[Online]. Available: https://www.imec-int.
com/en/articles/unlocking-system-scaling
-bot t lenecks-system-technology- co
-optimization
[15] M. G. Bardon, " DTCO including sustainability:
Power-performance-area-cost-environmental
score (PPACE) analysis for logic
technologies, " in Proc. IEEE Int. Electron
Devices Meeting (IEDM), 2020, pp. 41.4.1-
41.4.4, doi: 10.1109/IEDM13553.2020.
9372004.
[16] U. Gupta et al., " Chasing carbon: The elusive
environmental footprint of computing, "
in Proc. IEEE Int. Symp. High-Perform.
Comput. Archit. (HPCA), 2021, pp. 854-
867, doi: 10.1109/HPCA51647.2021.00076.
[17] C.-J. Wu, " Carbon impact of computing, "
in Proc. Int. Solid-State Circuits Conf. (ISSCC)
Panel Sustainability, 2023.
About the Author
Nadine Collaert (collaert@imec.be)
is a program director at Imec, 3001
Heverlee, Belgium. She is currently
responsible for the advanced RF
program looking at heterogeneous
integration of III-V/III-N devices with
advanced CMOS to tackle the challenges
of next-generation mobile communication.
Before that, she was
program director of the LOGIC Beyond
Si program focused on the research
of novel CMOS devices and new material-enabled
device and system approaches
to
increase functionality.
She has been involved in the theory,
design, and technology of FinFET devices,
emerging memories, transducers
for biomedical applications, and
the integration and characterization
of biocompatible materials. She has
a Ph.D. in electrical engineering from
KU Leuven, and she has more than
400 publications and holds more
than 10 patents in the field of device
design and process technology. She is
a Member of IEEE.
IEEE SOLID-STATE CIRCUITS MAGAZINE
http://dx.doi.org/10.1109/MDAT.2016.2544837
http://dx.doi.org/10.1109/MDAT.2016.2544837
https://www.imec-int.com/en/articles/unlocking-system-scaling-bottlenecks-system-technology-co-optimization
https://www.imec-int.com/en/articles/unlocking-system-scaling-bottlenecks-system-technology-co-optimization
https://www.imec-int.com/en/articles/unlocking-system-scaling-bottlenecks-system-technology-co-optimization
https://www.imec-int.com/en/articles/unlocking-system-scaling-bottlenecks-system-technology-co-optimization
https://www.embedded.com/integrating-cfet-into-the-logic-technology-roadmap-beyond-1-nm/
https://www.embedded.com/integrating-cfet-into-the-logic-technology-roadmap-beyond-1-nm/
https://www.embedded.com/integrating-cfet-into-the-logic-technology-roadmap-beyond-1-nm/
IEEE Solid-States Circuits Magazine - Summer 2023
Table of Contents for the Digital Edition of IEEE Solid-States Circuits Magazine - Summer 2023
Contents
IEEE Solid-States Circuits Magazine - Summer 2023 - Cover1
IEEE Solid-States Circuits Magazine - Summer 2023 - Cover2
IEEE Solid-States Circuits Magazine - Summer 2023 - Contents
IEEE Solid-States Circuits Magazine - Summer 2023 - 2
IEEE Solid-States Circuits Magazine - Summer 2023 - 3
IEEE Solid-States Circuits Magazine - Summer 2023 - 4
IEEE Solid-States Circuits Magazine - Summer 2023 - 5
IEEE Solid-States Circuits Magazine - Summer 2023 - 6
IEEE Solid-States Circuits Magazine - Summer 2023 - 7
IEEE Solid-States Circuits Magazine - Summer 2023 - 8
IEEE Solid-States Circuits Magazine - Summer 2023 - 9
IEEE Solid-States Circuits Magazine - Summer 2023 - 10
IEEE Solid-States Circuits Magazine - Summer 2023 - 11
IEEE Solid-States Circuits Magazine - Summer 2023 - 12
IEEE Solid-States Circuits Magazine - Summer 2023 - 13
IEEE Solid-States Circuits Magazine - Summer 2023 - 14
IEEE Solid-States Circuits Magazine - Summer 2023 - 15
IEEE Solid-States Circuits Magazine - Summer 2023 - 16
IEEE Solid-States Circuits Magazine - Summer 2023 - 17
IEEE Solid-States Circuits Magazine - Summer 2023 - 18
IEEE Solid-States Circuits Magazine - Summer 2023 - 19
IEEE Solid-States Circuits Magazine - Summer 2023 - 20
IEEE Solid-States Circuits Magazine - Summer 2023 - 21
IEEE Solid-States Circuits Magazine - Summer 2023 - 22
IEEE Solid-States Circuits Magazine - Summer 2023 - 23
IEEE Solid-States Circuits Magazine - Summer 2023 - 24
IEEE Solid-States Circuits Magazine - Summer 2023 - 25
IEEE Solid-States Circuits Magazine - Summer 2023 - 26
IEEE Solid-States Circuits Magazine - Summer 2023 - 27
IEEE Solid-States Circuits Magazine - Summer 2023 - 28
IEEE Solid-States Circuits Magazine - Summer 2023 - 29
IEEE Solid-States Circuits Magazine - Summer 2023 - 30
IEEE Solid-States Circuits Magazine - Summer 2023 - 31
IEEE Solid-States Circuits Magazine - Summer 2023 - 32
IEEE Solid-States Circuits Magazine - Summer 2023 - 33
IEEE Solid-States Circuits Magazine - Summer 2023 - 34
IEEE Solid-States Circuits Magazine - Summer 2023 - 35
IEEE Solid-States Circuits Magazine - Summer 2023 - 36
IEEE Solid-States Circuits Magazine - Summer 2023 - 37
IEEE Solid-States Circuits Magazine - Summer 2023 - 38
IEEE Solid-States Circuits Magazine - Summer 2023 - 39
IEEE Solid-States Circuits Magazine - Summer 2023 - 40
IEEE Solid-States Circuits Magazine - Summer 2023 - 41
IEEE Solid-States Circuits Magazine - Summer 2023 - 42
IEEE Solid-States Circuits Magazine - Summer 2023 - 43
IEEE Solid-States Circuits Magazine - Summer 2023 - 44
IEEE Solid-States Circuits Magazine - Summer 2023 - 45
IEEE Solid-States Circuits Magazine - Summer 2023 - 46
IEEE Solid-States Circuits Magazine - Summer 2023 - 47
IEEE Solid-States Circuits Magazine - Summer 2023 - 48
IEEE Solid-States Circuits Magazine - Summer 2023 - 49
IEEE Solid-States Circuits Magazine - Summer 2023 - 50
IEEE Solid-States Circuits Magazine - Summer 2023 - 51
IEEE Solid-States Circuits Magazine - Summer 2023 - 52
IEEE Solid-States Circuits Magazine - Summer 2023 - 53
IEEE Solid-States Circuits Magazine - Summer 2023 - 54
IEEE Solid-States Circuits Magazine - Summer 2023 - 55
IEEE Solid-States Circuits Magazine - Summer 2023 - 56
IEEE Solid-States Circuits Magazine - Summer 2023 - 57
IEEE Solid-States Circuits Magazine - Summer 2023 - 58
IEEE Solid-States Circuits Magazine - Summer 2023 - 59
IEEE Solid-States Circuits Magazine - Summer 2023 - 60
IEEE Solid-States Circuits Magazine - Summer 2023 - 61
IEEE Solid-States Circuits Magazine - Summer 2023 - 62
IEEE Solid-States Circuits Magazine - Summer 2023 - 63
IEEE Solid-States Circuits Magazine - Summer 2023 - 64
IEEE Solid-States Circuits Magazine - Summer 2023 - 65
IEEE Solid-States Circuits Magazine - Summer 2023 - 66
IEEE Solid-States Circuits Magazine - Summer 2023 - 67
IEEE Solid-States Circuits Magazine - Summer 2023 - 68
IEEE Solid-States Circuits Magazine - Summer 2023 - 69
IEEE Solid-States Circuits Magazine - Summer 2023 - 70
IEEE Solid-States Circuits Magazine - Summer 2023 - 71
IEEE Solid-States Circuits Magazine - Summer 2023 - 72
IEEE Solid-States Circuits Magazine - Summer 2023 - 73
IEEE Solid-States Circuits Magazine - Summer 2023 - 74
IEEE Solid-States Circuits Magazine - Summer 2023 - 75
IEEE Solid-States Circuits Magazine - Summer 2023 - 76
IEEE Solid-States Circuits Magazine - Summer 2023 - 77
IEEE Solid-States Circuits Magazine - Summer 2023 - 78
IEEE Solid-States Circuits Magazine - Summer 2023 - 79
IEEE Solid-States Circuits Magazine - Summer 2023 - 80
IEEE Solid-States Circuits Magazine - Summer 2023 - 81
IEEE Solid-States Circuits Magazine - Summer 2023 - 82
IEEE Solid-States Circuits Magazine - Summer 2023 - 83
IEEE Solid-States Circuits Magazine - Summer 2023 - 84
IEEE Solid-States Circuits Magazine - Summer 2023 - 85
IEEE Solid-States Circuits Magazine - Summer 2023 - 86
IEEE Solid-States Circuits Magazine - Summer 2023 - 87
IEEE Solid-States Circuits Magazine - Summer 2023 - 88
IEEE Solid-States Circuits Magazine - Summer 2023 - 89
IEEE Solid-States Circuits Magazine - Summer 2023 - 90
IEEE Solid-States Circuits Magazine - Summer 2023 - 91
IEEE Solid-States Circuits Magazine - Summer 2023 - 92
IEEE Solid-States Circuits Magazine - Summer 2023 - 93
IEEE Solid-States Circuits Magazine - Summer 2023 - 94
IEEE Solid-States Circuits Magazine - Summer 2023 - 95
IEEE Solid-States Circuits Magazine - Summer 2023 - 96
IEEE Solid-States Circuits Magazine - Summer 2023 - 97
IEEE Solid-States Circuits Magazine - Summer 2023 - 98
IEEE Solid-States Circuits Magazine - Summer 2023 - 99
IEEE Solid-States Circuits Magazine - Summer 2023 - 100
IEEE Solid-States Circuits Magazine - Summer 2023 - 101
IEEE Solid-States Circuits Magazine - Summer 2023 - 102
IEEE Solid-States Circuits Magazine - Summer 2023 - 103
IEEE Solid-States Circuits Magazine - Summer 2023 - 104
IEEE Solid-States Circuits Magazine - Summer 2023 - 105
IEEE Solid-States Circuits Magazine - Summer 2023 - 106
IEEE Solid-States Circuits Magazine - Summer 2023 - 107
IEEE Solid-States Circuits Magazine - Summer 2023 - 108
IEEE Solid-States Circuits Magazine - Summer 2023 - 109
IEEE Solid-States Circuits Magazine - Summer 2023 - 110
IEEE Solid-States Circuits Magazine - Summer 2023 - 111
IEEE Solid-States Circuits Magazine - Summer 2023 - 112
IEEE Solid-States Circuits Magazine - Summer 2023 - 113
IEEE Solid-States Circuits Magazine - Summer 2023 - 114
IEEE Solid-States Circuits Magazine - Summer 2023 - 115
IEEE Solid-States Circuits Magazine - Summer 2023 - 116
IEEE Solid-States Circuits Magazine - Summer 2023 - 117
IEEE Solid-States Circuits Magazine - Summer 2023 - 118
IEEE Solid-States Circuits Magazine - Summer 2023 - 119
IEEE Solid-States Circuits Magazine - Summer 2023 - 120
IEEE Solid-States Circuits Magazine - Summer 2023 - 121
IEEE Solid-States Circuits Magazine - Summer 2023 - 122
IEEE Solid-States Circuits Magazine - Summer 2023 - 123
IEEE Solid-States Circuits Magazine - Summer 2023 - 124
IEEE Solid-States Circuits Magazine - Summer 2023 - 125
IEEE Solid-States Circuits Magazine - Summer 2023 - 126
IEEE Solid-States Circuits Magazine - Summer 2023 - 127
IEEE Solid-States Circuits Magazine - Summer 2023 - 128
IEEE Solid-States Circuits Magazine - Summer 2023 - Cover3
IEEE Solid-States Circuits Magazine - Summer 2023 - Cover4
https://www.nxtbook.com/nxtbooks/ieee/mssc_fall2023
https://www.nxtbook.com/nxtbooks/ieee/mssc_summer2023
https://www.nxtbook.com/nxtbooks/ieee/mssc_spring2023
https://www.nxtbook.com/nxtbooks/ieee/mssc_winter2023
https://www.nxtbook.com/nxtbooks/ieee/mssc_fall2022
https://www.nxtbook.com/nxtbooks/ieee/mssc_summer2022
https://www.nxtbook.com/nxtbooks/ieee/mssc_spring2022
https://www.nxtbook.com/nxtbooks/ieee/mssc_winter2022
https://www.nxtbook.com/nxtbooks/ieee/mssc_fall2021
https://www.nxtbook.com/nxtbooks/ieee/mssc_summer2021
https://www.nxtbook.com/nxtbooks/ieee/mssc_spring2021
https://www.nxtbook.com/nxtbooks/ieee/mssc_winter2021
https://www.nxtbook.com/nxtbooks/ieee/mssc_fall2020
https://www.nxtbook.com/nxtbooks/ieee/mssc_summer2020
https://www.nxtbook.com/nxtbooks/ieee/mssc_spring2020
https://www.nxtbook.com/nxtbooks/ieee/mssc_winter2020
https://www.nxtbook.com/nxtbooks/ieee/mssc_fall2019
https://www.nxtbook.com/nxtbooks/ieee/mssc_summer2019
https://www.nxtbook.com/nxtbooks/ieee/mssc_2019summer
https://www.nxtbook.com/nxtbooks/ieee/mssc_2019winter
https://www.nxtbook.com/nxtbooks/ieee/mssc_2018fall
https://www.nxtbook.com/nxtbooks/ieee/mssc_2018summer
https://www.nxtbook.com/nxtbooks/ieee/mssc_2018spring
https://www.nxtbook.com/nxtbooks/ieee/mssc_2018winter
https://www.nxtbook.com/nxtbooks/ieee/solidstatecircuits_winter2017
https://www.nxtbook.com/nxtbooks/ieee/solidstatecircuits_fall2017
https://www.nxtbook.com/nxtbooks/ieee/solidstatecircuits_summer2017
https://www.nxtbook.com/nxtbooks/ieee/solidstatecircuits_spring2017
https://www.nxtbook.com/nxtbooks/ieee/solidstatecircuits_winter2016
https://www.nxtbook.com/nxtbooks/ieee/solidstatecircuits_fall2016
https://www.nxtbook.com/nxtbooks/ieee/solidstatecircuits_summer2016
https://www.nxtbook.com/nxtbooks/ieee/solidstatecircuits_spring2016
https://www.nxtbook.com/nxtbooks/ieee/solidstatecircuits_winter2015
https://www.nxtbook.com/nxtbooks/ieee/solidstatecircuits_fall2015
https://www.nxtbook.com/nxtbooks/ieee/solidstatecircuits_summer2015
https://www.nxtbook.com/nxtbooks/ieee/solidstatecircuits_spring2015
https://www.nxtbook.com/nxtbooks/ieee/solidstatecircuits_winter2014
https://www.nxtbook.com/nxtbooks/ieee/solidstatecircuits_fall2014
https://www.nxtbook.com/nxtbooks/ieee/solidstatecircuits_summer2014
https://www.nxtbook.com/nxtbooks/ieee/solidstatecircuits_spring2014
https://www.nxtbookmedia.com