IEEE Power Electronics Magazine - March 2021 - 63
FIG 13 NISM outcome for PI3106-00-HVMZ before (green) and after capacitor additions (red).
of Computer Science and Electrical Engineering, as well as
teaching both mechanical and electrical engineering undergraduates at the UMBC campus in Baltimore, Maryland.
References
[1] " Power integrity - Measuring, " in Optimizing and Troubleshooting
Power Related Parameters in Electronic Systems, S. M. Sandler, Ed.
McGraw Hill, 2014.
[2] " Omicron Lab Bode 100 - Application note traditional and non-invasive
stability measurements. " [Online]. Available: https://www.picotest.com/
measurements/NISM.html
[3] R. W. Erickson and D. Maksimovic´, Eds., Fundamentals of Power Electronics, 2nd ed. Kluwer.
[4] " 500W remote sense PRM for post-PFC operation datasheet, " PRM-
FIG 14 Time domain response of the PI3106-00-HVMZ. Traces Gate drive (green), output voltage (yellow), load current (blue).
2011 and then transferred to Vicor (UK) Limited, Camberley
GU153YL, U.K. in mid-2018. He has enjoyed a background in
semiconductor electronics and varied work assignments
with large European and U.S. semiconductor companies
such as Hughes Network Systems, Analog Devices, National
Semiconductor and Micrel Semiconductor, covering the
fields of microwave, RF, analog/mixed-signal and power
electronics over the past 35 years. He is a postgraduate, both
of Southampton University in the U.K. and the Whiting
School of Engineering at Johns Hopkins University in Maryland, United States. He was University of Maryland-Baltimore County's (UMBC) first professor of Practice in Computer Engineering, leading successful undergraduate capstone course and project development efforts in the School
48JF480T500A00.
[5] " Evaluation board evaluation user guide UG:013, " VI Chip® R-S PRM.
[6] R. Ridley, " Output impedance measurements and loop gains. " [Online].
Available: www.ridleyengineering.com
[7] J. Stevens, " Simplifying stability checks, " Application Rep. SLVA381B "
Texas Instruments.
[8] " AN-1733: Load transient testing simplified, " Application Rep. SNOA57,
Texas Instruments, 2007.
[9] J. Williams, " AN:014: Load transient response testing for voltage regulators, " Linear Technol., 2006.
[10] F. Hämmerle, Omicron Lab Bode100 Application Note. " Loop gain measurement - The voltage injection method using the Bode100 and B-WIT 100, "
Omicron Labs, 2017.
[11] " 28 volt M-grade ZVS isolated converter module PI3106-00-HVMZ datasheet. "
[12] " UG:301 PI31xx-xx-EVAL1 ZVS isolated DC-DC converter evaluation
board user guide. "
March 2021 z IEEE POWER ELECTRONICS MAGAZINE
63
https://www.picotest.com/measurements/NISM.html
https://www.picotest.com/measurements/NISM.html
http://www.ridleyengineering.com
IEEE Power Electronics Magazine - March 2021
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