IEEE Solid-State Circuits Magazine - Fall 2016 - 63

from negative to positive. All the P
message are now positive LLR, and
all the hard-decision messages are
zero, as shown in Figure 5.

References

[1] Consultative Committee for Space Data
Systems (2016). [Online]. Available: http://
cwe.ccsds.org/
[2] IEEE. (2012). IEEE Standard for Air Interface
for Broadband Wireless Access Systems. IEEE
Standard 802.16-2012. [Online]. Available: https://standards.ieee.org/findstds/
standard/802.16-2012.html
[3] Working Groups' Status, (2016, Feb.). IEEE
Standards Working Group on Error Correction Coding for Non-volatile Memories.
IEEE P1890. [Online]. Available: https://
ieee-sa.imeetcentral.com/p1890wgpublic/raw/Status/IEEE _ Flash _ Standard _
Status.pdf
[4] R. W. Hamming, "The bell system technical journal," Bell Syst. Tech. J., vol. XXVI,
no. 2, pp. 147-160, 1950.
[5] D. E. Muller, "Application of Boolean algebra to switching circuit design and to
error detection," Trans. IRE Profess. Group
Electron. Computers, vol. EC-3, no. 3, pp.
6-12, Sept. 1954.
[6] I. S. Reed and G. Solomon, "Polynomial
codes over certain finite fields," J. Appl.
Maths, vol. 8, no. 2, pp. 300-304, 1960.
[7] R. C. Bose and D. K. Ray-Chaudhuri, "On
a class of error correcting binary group
codes," Inf. Control, vol. 3, no. 1, pp. 68-79,
Mar. 1960.
[8] R. G. Gallager, "Low-density parity-check
codes." IRE Trans. Inf. Theory, vol. 8, no. 1,
pp. 21-28, 1962.
[9] C. Berrou, A. Glavieux, and P. Thitimajshima, "Near Shannon limit error-correcting
coding and decoding: Turbo codes," in
Proc. IEEE Int. Conf. Communications,
Geneva, 1993, vol. 2, pp. 1064-1070.
[10] E. Arikan, "Channel polarization: A method for constructing capacity achieving
codes for symmetric binary-input memoryless channels," IEEE Trans. Inf. Theory,
vol. 55, no. 7, pp. 3051-3073, 2009.
[11] M. Fossorier, M. Mihaljevi´c, and H. Imai,
"Reduced complexity iterative decoding of low-density parity check codes
based on belief propagation," IEEE Trans.
Commun., vol. 47, no. 5, pp. 673-680, May
1999.
[12] K. Gunnam. (2014, Aug.). LDPC decoding:
VLSI architectures and implementations,

presented at Flash Memory Summit, Santa
Clara, CA. [Online]. Available: http://sites
.ieee.org/scv-pace/files/2014/08/FMS14LDPC-Module2.pdf

About the Authors
Kiran Gunnam (kgunnam@ieee.org)
currently works as a technologist in
the Storage Architecture Research
Group of Western Digital Corporation. He was previously the director
of engineering at Violin Memory and
also held R&D positions at Nvidia,
Blackberry, LSI Corporation, Marvell
Semiconductor, Schlumberger, and
Intel. He is an expert in IC implementation of communications and signal
processing systems. His Ph.D. research contributed several key innovations in advanced error-correction
systems based on low-density paritycheck codes and led to several industry designs. He has done extensive
work on ASIC hardware architecture,
microarchitecture, and digital IC implementation for many applications
(including IEEE 802.11n Wi-Fi, IEEE
802.16e Wi-Max, IEEE 802.3 10-GB,
holographic read channel, hard-diskdrive read channel, and flash read
channel). He has more than 60 patents, with several others pending. He
was an IEEE Solid-State Circuits Society Distinguished Lecturer for 2013
and 2014. He received the M.S.E.E.
and Ph.D. degrees in computer engineering from Texas A&M University,
College Station, United States.
Joan Marc Català Pérez (joacape@
epsg.upv.es) received his B.S. degree
in telecommunication engineering

from the Escuela Politecnica Superior
de Gandia, Spain, in 2008, and his
M.S. degree in electrical engineering
from the Universitat Politècnica de
València, Spain, in 2009. He is currently pursuing his Ph.D. degree in
electrical engineering with the Institute of Telecommunications and
Multimedia Applications at the Universitat Politècnica de València and
has worked as a research engineer
with Dexilon Company, Spain, since
2014. His research interests include
the design of new architectures and
algorithms for forward error correction and electronic article surveillance and RFID systems.
Francisco Garcia-Herrero
(fmgarcia@uemc.es) received the
B.S. degree in telecommunication
engineering from the Escuela Politecnica Superior de Gandia, Spain, in
2008, and the M.S. and Ph.D. degrees
in electrical engineering from the
Universitat Politècnica de València,
Spain, in 2010 and 2013, respectively.
He is an associate professor of computer engineering with the European
University Miguel de Cervantes, Valladolid, Spain, where he is a member
of the Grupo de Investigación en Discapacidad Física y Sensorial. He also
collaborates in the Ph.D. degree program in electronic engineering at the
Universitat Politècnica de València.
His research interests include hardware and algorithmic optimization
of error-control decoders, fault-tolerance in consumer electronics, and
assistive technology.

IEEE SOLID-STATE CIRCUITS MAGAZINE

fa l l 2 0 16

63


http://sites http://www.ieee.org/scv-pace/files/2014/08/FMS14 http://http:// http://cwe.ccsds.org/ https://standards.ieee.org/findstds/ http://https:// http://ieee-sa.imeetcentral.com/p1890wgpub

Table of Contents for the Digital Edition of IEEE Solid-State Circuits Magazine - Fall 2016

IEEE Solid-State Circuits Magazine - Fall 2016 - Cover1
IEEE Solid-State Circuits Magazine - Fall 2016 - Cover2
IEEE Solid-State Circuits Magazine - Fall 2016 - 1
IEEE Solid-State Circuits Magazine - Fall 2016 - 2
IEEE Solid-State Circuits Magazine - Fall 2016 - 3
IEEE Solid-State Circuits Magazine - Fall 2016 - 4
IEEE Solid-State Circuits Magazine - Fall 2016 - 5
IEEE Solid-State Circuits Magazine - Fall 2016 - 6
IEEE Solid-State Circuits Magazine - Fall 2016 - 7
IEEE Solid-State Circuits Magazine - Fall 2016 - 8
IEEE Solid-State Circuits Magazine - Fall 2016 - 9
IEEE Solid-State Circuits Magazine - Fall 2016 - 10
IEEE Solid-State Circuits Magazine - Fall 2016 - 11
IEEE Solid-State Circuits Magazine - Fall 2016 - 12
IEEE Solid-State Circuits Magazine - Fall 2016 - 13
IEEE Solid-State Circuits Magazine - Fall 2016 - 14
IEEE Solid-State Circuits Magazine - Fall 2016 - 15
IEEE Solid-State Circuits Magazine - Fall 2016 - 16
IEEE Solid-State Circuits Magazine - Fall 2016 - 17
IEEE Solid-State Circuits Magazine - Fall 2016 - 18
IEEE Solid-State Circuits Magazine - Fall 2016 - 19
IEEE Solid-State Circuits Magazine - Fall 2016 - 20
IEEE Solid-State Circuits Magazine - Fall 2016 - 21
IEEE Solid-State Circuits Magazine - Fall 2016 - 22
IEEE Solid-State Circuits Magazine - Fall 2016 - 23
IEEE Solid-State Circuits Magazine - Fall 2016 - 24
IEEE Solid-State Circuits Magazine - Fall 2016 - 25
IEEE Solid-State Circuits Magazine - Fall 2016 - 26
IEEE Solid-State Circuits Magazine - Fall 2016 - 27
IEEE Solid-State Circuits Magazine - Fall 2016 - 28
IEEE Solid-State Circuits Magazine - Fall 2016 - 29
IEEE Solid-State Circuits Magazine - Fall 2016 - 30
IEEE Solid-State Circuits Magazine - Fall 2016 - 31
IEEE Solid-State Circuits Magazine - Fall 2016 - 32
IEEE Solid-State Circuits Magazine - Fall 2016 - 33
IEEE Solid-State Circuits Magazine - Fall 2016 - 34
IEEE Solid-State Circuits Magazine - Fall 2016 - 35
IEEE Solid-State Circuits Magazine - Fall 2016 - 36
IEEE Solid-State Circuits Magazine - Fall 2016 - 37
IEEE Solid-State Circuits Magazine - Fall 2016 - 38
IEEE Solid-State Circuits Magazine - Fall 2016 - 39
IEEE Solid-State Circuits Magazine - Fall 2016 - 40
IEEE Solid-State Circuits Magazine - Fall 2016 - 41
IEEE Solid-State Circuits Magazine - Fall 2016 - 42
IEEE Solid-State Circuits Magazine - Fall 2016 - 43
IEEE Solid-State Circuits Magazine - Fall 2016 - 44
IEEE Solid-State Circuits Magazine - Fall 2016 - 45
IEEE Solid-State Circuits Magazine - Fall 2016 - 46
IEEE Solid-State Circuits Magazine - Fall 2016 - 47
IEEE Solid-State Circuits Magazine - Fall 2016 - 48
IEEE Solid-State Circuits Magazine - Fall 2016 - 49
IEEE Solid-State Circuits Magazine - Fall 2016 - 50
IEEE Solid-State Circuits Magazine - Fall 2016 - 51
IEEE Solid-State Circuits Magazine - Fall 2016 - 52
IEEE Solid-State Circuits Magazine - Fall 2016 - 53
IEEE Solid-State Circuits Magazine - Fall 2016 - 54
IEEE Solid-State Circuits Magazine - Fall 2016 - 55
IEEE Solid-State Circuits Magazine - Fall 2016 - 56
IEEE Solid-State Circuits Magazine - Fall 2016 - 57
IEEE Solid-State Circuits Magazine - Fall 2016 - 58
IEEE Solid-State Circuits Magazine - Fall 2016 - 59
IEEE Solid-State Circuits Magazine - Fall 2016 - 60
IEEE Solid-State Circuits Magazine - Fall 2016 - 61
IEEE Solid-State Circuits Magazine - Fall 2016 - 62
IEEE Solid-State Circuits Magazine - Fall 2016 - 63
IEEE Solid-State Circuits Magazine - Fall 2016 - 64
IEEE Solid-State Circuits Magazine - Fall 2016 - 65
IEEE Solid-State Circuits Magazine - Fall 2016 - 66
IEEE Solid-State Circuits Magazine - Fall 2016 - 67
IEEE Solid-State Circuits Magazine - Fall 2016 - 68
IEEE Solid-State Circuits Magazine - Fall 2016 - 69
IEEE Solid-State Circuits Magazine - Fall 2016 - 70
IEEE Solid-State Circuits Magazine - Fall 2016 - 71
IEEE Solid-State Circuits Magazine - Fall 2016 - 72
IEEE Solid-State Circuits Magazine - Fall 2016 - 73
IEEE Solid-State Circuits Magazine - Fall 2016 - 74
IEEE Solid-State Circuits Magazine - Fall 2016 - 75
IEEE Solid-State Circuits Magazine - Fall 2016 - 76
IEEE Solid-State Circuits Magazine - Fall 2016 - 77
IEEE Solid-State Circuits Magazine - Fall 2016 - 78
IEEE Solid-State Circuits Magazine - Fall 2016 - 79
IEEE Solid-State Circuits Magazine - Fall 2016 - 80
IEEE Solid-State Circuits Magazine - Fall 2016 - 81
IEEE Solid-State Circuits Magazine - Fall 2016 - 82
IEEE Solid-State Circuits Magazine - Fall 2016 - 83
IEEE Solid-State Circuits Magazine - Fall 2016 - 84
IEEE Solid-State Circuits Magazine - Fall 2016 - 85
IEEE Solid-State Circuits Magazine - Fall 2016 - 86
IEEE Solid-State Circuits Magazine - Fall 2016 - 87
IEEE Solid-State Circuits Magazine - Fall 2016 - 88
IEEE Solid-State Circuits Magazine - Fall 2016 - 89
IEEE Solid-State Circuits Magazine - Fall 2016 - 90
IEEE Solid-State Circuits Magazine - Fall 2016 - 91
IEEE Solid-State Circuits Magazine - Fall 2016 - 92
IEEE Solid-State Circuits Magazine - Fall 2016 - 93
IEEE Solid-State Circuits Magazine - Fall 2016 - 94
IEEE Solid-State Circuits Magazine - Fall 2016 - 95
IEEE Solid-State Circuits Magazine - Fall 2016 - 96
IEEE Solid-State Circuits Magazine - Fall 2016 - 97
IEEE Solid-State Circuits Magazine - Fall 2016 - 98
IEEE Solid-State Circuits Magazine - Fall 2016 - 99
IEEE Solid-State Circuits Magazine - Fall 2016 - 100
IEEE Solid-State Circuits Magazine - Fall 2016 - 101
IEEE Solid-State Circuits Magazine - Fall 2016 - 102
IEEE Solid-State Circuits Magazine - Fall 2016 - 103
IEEE Solid-State Circuits Magazine - Fall 2016 - 104
IEEE Solid-State Circuits Magazine - Fall 2016 - 105
IEEE Solid-State Circuits Magazine - Fall 2016 - 106
IEEE Solid-State Circuits Magazine - Fall 2016 - 107
IEEE Solid-State Circuits Magazine - Fall 2016 - 108
IEEE Solid-State Circuits Magazine - Fall 2016 - 109
IEEE Solid-State Circuits Magazine - Fall 2016 - 110
IEEE Solid-State Circuits Magazine - Fall 2016 - 111
IEEE Solid-State Circuits Magazine - Fall 2016 - 112
IEEE Solid-State Circuits Magazine - Fall 2016 - 113
IEEE Solid-State Circuits Magazine - Fall 2016 - 114
IEEE Solid-State Circuits Magazine - Fall 2016 - 115
IEEE Solid-State Circuits Magazine - Fall 2016 - 116
IEEE Solid-State Circuits Magazine - Fall 2016 - 117
IEEE Solid-State Circuits Magazine - Fall 2016 - 118
IEEE Solid-State Circuits Magazine - Fall 2016 - 119
IEEE Solid-State Circuits Magazine - Fall 2016 - 120
IEEE Solid-State Circuits Magazine - Fall 2016 - 121
IEEE Solid-State Circuits Magazine - Fall 2016 - 122
IEEE Solid-State Circuits Magazine - Fall 2016 - 123
IEEE Solid-State Circuits Magazine - Fall 2016 - 124
IEEE Solid-State Circuits Magazine - Fall 2016 - Cover3
IEEE Solid-State Circuits Magazine - Fall 2016 - Cover4
https://www.nxtbook.com/nxtbooks/ieee/mssc_fall2023
https://www.nxtbook.com/nxtbooks/ieee/mssc_summer2023
https://www.nxtbook.com/nxtbooks/ieee/mssc_spring2023
https://www.nxtbook.com/nxtbooks/ieee/mssc_winter2023
https://www.nxtbook.com/nxtbooks/ieee/mssc_fall2022
https://www.nxtbook.com/nxtbooks/ieee/mssc_summer2022
https://www.nxtbook.com/nxtbooks/ieee/mssc_spring2022
https://www.nxtbook.com/nxtbooks/ieee/mssc_winter2022
https://www.nxtbook.com/nxtbooks/ieee/mssc_fall2021
https://www.nxtbook.com/nxtbooks/ieee/mssc_summer2021
https://www.nxtbook.com/nxtbooks/ieee/mssc_spring2021
https://www.nxtbook.com/nxtbooks/ieee/mssc_winter2021
https://www.nxtbook.com/nxtbooks/ieee/mssc_fall2020
https://www.nxtbook.com/nxtbooks/ieee/mssc_summer2020
https://www.nxtbook.com/nxtbooks/ieee/mssc_spring2020
https://www.nxtbook.com/nxtbooks/ieee/mssc_winter2020
https://www.nxtbook.com/nxtbooks/ieee/mssc_fall2019
https://www.nxtbook.com/nxtbooks/ieee/mssc_summer2019
https://www.nxtbook.com/nxtbooks/ieee/mssc_2019summer
https://www.nxtbook.com/nxtbooks/ieee/mssc_2019winter
https://www.nxtbook.com/nxtbooks/ieee/mssc_2018fall
https://www.nxtbook.com/nxtbooks/ieee/mssc_2018summer
https://www.nxtbook.com/nxtbooks/ieee/mssc_2018spring
https://www.nxtbook.com/nxtbooks/ieee/mssc_2018winter
https://www.nxtbook.com/nxtbooks/ieee/solidstatecircuits_winter2017
https://www.nxtbook.com/nxtbooks/ieee/solidstatecircuits_fall2017
https://www.nxtbook.com/nxtbooks/ieee/solidstatecircuits_summer2017
https://www.nxtbook.com/nxtbooks/ieee/solidstatecircuits_spring2017
https://www.nxtbook.com/nxtbooks/ieee/solidstatecircuits_winter2016
https://www.nxtbook.com/nxtbooks/ieee/solidstatecircuits_fall2016
https://www.nxtbook.com/nxtbooks/ieee/solidstatecircuits_summer2016
https://www.nxtbook.com/nxtbooks/ieee/solidstatecircuits_spring2016
https://www.nxtbook.com/nxtbooks/ieee/solidstatecircuits_winter2015
https://www.nxtbook.com/nxtbooks/ieee/solidstatecircuits_fall2015
https://www.nxtbook.com/nxtbooks/ieee/solidstatecircuits_summer2015
https://www.nxtbook.com/nxtbooks/ieee/solidstatecircuits_spring2015
https://www.nxtbook.com/nxtbooks/ieee/solidstatecircuits_winter2014
https://www.nxtbook.com/nxtbooks/ieee/solidstatecircuits_fall2014
https://www.nxtbook.com/nxtbooks/ieee/solidstatecircuits_summer2014
https://www.nxtbook.com/nxtbooks/ieee/solidstatecircuits_spring2014
https://www.nxtbookmedia.com