IEEE Solid-State Circuits Magazine - Fall 2017 - 24

FD-SOI Transistors Features Variation with the Body Biasing Tuning
FD-SOI semiconductor physics predicts that the main design transistor's
parameters (such as Gm or fT ) do not

Switch Resistance (Ω)

1,400

depend on the body biasing variation
for an operation at a given constant
current. Figures 12 and 13 illustrate
this aspect by providing measurement curves for different devices.

wn = 1 u

1,200

wp = 2 u

1,000

28LP CMOS
28FDSOI noBB
28FDSOI FBB±1.8 V

943 Ω

800
600

288 Ω

400
200

0

0.2

0.4
0.6
0.8
Input Voltage (V)

25 Ω
1

[S]

1.5

gm Meas [E-3]

FIGURE 11: An LVT CMOS switch resistance variation with respect to input voltage, comparing a 28-nm FD-SOI CMOS and a 28-nm LP bulk.

1.0

0.5

0
1E-7

1E-6

1E-5
1E-4
1E-3
[log A]
id [LOG]
gm Versus id (W = 1e-06 L = 3e-08 MODEL = Ivtnfet)

30

[Hz]

[S]

FIGURE 12: A 28-nm FD-SOI LVT CMOS 1 µm/30 nm transistor measured Gm for different
drain currents, where Vbody varies from 0 to 2 V, Vds = 1.1 V.

Analog/RF FD-SOI Specific
Tuning and Trimming Techniques
Using Body Biasing
By taking advantage of the unique
very wide-band body biasing voltage
range available in FD-SOI technologies, the state of the art proposes
several unique techniques bringing
uncontested chip energy saving and
revisiting system performances.
A first method consists of generating and mak ing available on
chip BB voltages (a pair, for NMOS
and PMOS transistors) variable over
time and process, voltage, and temperature (PV T) variations. Starting from these voltages, we can
cancel system-level PVT variations
by continuously tuning transistors' respective VT . Several design
examples can be found in [7]-[9].
As well, reconfiguration at circuit/
block/system depending on application operation mode is enabled.
Design examples can be found in
[10] (at block level) and [9] (at system level). Finally, we can propose
new energy-efficient design techniques for tunable blocks via body
tie, as in [11].
A second method consists of generating and making available on chip
fixed body bias voltages. In such
cases, the design can efficiently
enable operation at ULV (0.5 V) and in the
same time increase circuit speed.
Some design examples are [12] and

400

fT [E + 9]

gm [E + 3]

300
20

10

0

200
100

0

5

10
15
id [E-3]

20

25
[A]

0
0.0

0.2

0.4
0.6
id [E-3]

0.8

gm Versus id (vds = 1 WFING = 1e-06
L = 3e-08 MODEL = Ivtnfet_rf)

fT Versus id (vds = 1 WFING = 1e-06
L = 3e-08 MODEL = Ivtnfet_rf)

(a)

(b)

1.0
[A]

FIGURE 13: A 28-nm FD-SOI LVT CMOS 1 µmX20 fingers/30 nm transistor* measured Gm and fT for different drain currents, where Vbody
varies from 0 to 2 V, Vds = 1.1 V. ()*: intrinsic device (FEOL plus Metal 1).

24

FA L L 2 0 17

IEEE SOLID-STATE CIRCUITS MAGAZINE



Table of Contents for the Digital Edition of IEEE Solid-State Circuits Magazine - Fall 2017

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