IEEE Solid-State Circuits Magazine - Spring 2016 - 23

Chulwoo Kim, Hyun-Woo Lee, and Junyoung Song

Memory Interfaces
Past, present, and future

I

ver the last few decades, the bandwidth of
dynamic random-access memory (DRAM)
has increased significantly through innovative architectures and circuit-level techniques to overcome the well-known "memory
wall" problem. We can understand the past challenges
of DRAM input/output (I/O) by investigating the technologies utilized for DRAM I/O in the transition from
Digital Object Identifier 10.1109/MSSC.2016.2546659
Date of publication: 21 June 2016

1943-0582/16©2016IEEE

single-data-rate (SDR) synchronous DRAM (SDRAM)to
double-data-rate (DDR) SDRAM. Recently developed versions of low-power DDR four (LPDDR4) and synchronous
graphics DDR five (GDDR5) employ new I/O features for
further bandwidth increase. Looking beyond LPDDR4
and GDDR5, what should be done to make another jump
in bandwidth increase for DRAM?
In this article, we first consider important DRAM
interface design issues of the past and present. Then, by
reviewing the development of high-performance DRAM
technologies in conjunction with the DRAM interface

IEEE SOLID-STATE CIRCUITS MAGAZINE

S P R I N G 2 0 16

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Table of Contents for the Digital Edition of IEEE Solid-State Circuits Magazine - Spring 2016

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