IEEE Solid-State Circuits Magazine - Spring 2016 - 87
Equivalent Circuit
of Real Charge Pump
Power Efficiency
of Real Charge Pump
Figure 7(a) explains how design parameters need to be updated starting from
the ideal case where a B = VTH = 0. You
want to keep IOUT-VOUT. N would need
to be increased as VTH is increased to
keep VMAX. Then, C would also need to
be increased to keep RPMP. Because IIN is
approximately proportional to N for a
charge pump with large N, IIN increases
as VTH whereas IOUT is kept the same.
As a result, h decreases. Even if an
increase in VTH is not too large to
increase N, C needs to be increased
to keep IOUT at VOUT of interest. That
increases the parasitic term of IIN in (7),
resulting in a decrease in h. Similarly,
an increase in a B increases the parasitic term of IIN, resulting in a decrease
in h. Larger a T requires larger N to
keep VMAX and RPMP. As a result, an
increase in aT can decrease h as well.
VIN
CPMP
~(1+αT)NC/3
GIN
IOUT =
IOUT
+
-
1:M
+
-
N
(1+αT)fc
RPMP =
VD = (N + 1)VT RPMP
IIN
fC (1+αT)
N
a N
1+αT
+
-
VOUT
(9)
+ 1b VIN - (N + 1)VT -VOUT
FIGURE 6: An equivalent circuit in a real case.
IOUT
RPMP =
VTH ↑
N
(1+αT)fc
N ↑(to Keep VMAX)
C ↑(to Keep RPMP)
IIN = (N + 1) IOUT + fαB NCVIN
(When αT Is Neglected)
N + 1bV - (N + 1)V
N & C & α B↑
IIN ↑ η ↓
VMAX = a
IN
T
1 + αT
(a)
VOUT
IOUT
IIN = IIN(IOUT,
αT, αB, VTH > 0)
POUT
IIN
VOUT
×
VOUT
VMAX
×
VIN
VOUT
VOUT
VMAX
÷
VMAX
PIN
VOUT
VOUT
VMAX
POUT
PIN
1
VOUT
(b)
Ideal
Real
η
VOUT
VOUT
VMAX
VMAX
VMAX
N
C
αT
αB
VTH
7
10 pF
0
0
0V
10
13.4 pF
0.1
0.1
0.5 V
100
Power Efficiency (%)
What is the impact of parasitic components on the charge pump characteristics in the actual case where
there is a finite parasitic capacitance
at the top and bottom plate of capacitors including clock drivers and a
finite threshold voltage of switching
devices? Figure 5 explains how IIN is
given by IOUT [22]. IIN has two components: intrinsic and parasitic capacitance terms. The intrinsic term is a
function of IOUT, N, and a T whereas
the loss term includes a T C, a B C, N,
VIN, and f, where a T and a B are the
top and bottom plate parasitic capacitance ratio to the pump capacitor.
Note that a B C needs to include the
gate and junction capacitance of the
driver for pump capacitors. Power
efficiency h is then expressed by a
ratio of POUT to P IN as described in (8).
Figure 6 describes an equivalent
circuit in the real case. Conversion
ratio M, output impedance RPMP, and
effective load capacitance CPMP are
updated to include a T over the ideal
case shown in Figure 3(b). GIN shows
the switching loss proportional to
the operating frequency. For a light
load with I OUT " 0, GIN degrades h.
αT
N
+ 1b
+ αBb fNC M = a
GIN = a
1 + αT
1 + αT
80
Ideal
PC
60
PD
40
VOUT ↑
Real
PB
20
0
PA
Pout
(c)
FIGURE 7: (a) VOUT versus IOUT, (b) VOUT versus h , and (c) POUT versus h in a real case.
IEEE SOLID-STATE CIRCUITS MAGAZINE
S P R I N G 2 0 16
87
Table of Contents for the Digital Edition of IEEE Solid-State Circuits Magazine - Spring 2016
IEEE Solid-State Circuits Magazine - Spring 2016 - Cover1
IEEE Solid-State Circuits Magazine - Spring 2016 - Cover2
IEEE Solid-State Circuits Magazine - Spring 2016 - 1
IEEE Solid-State Circuits Magazine - Spring 2016 - 2
IEEE Solid-State Circuits Magazine - Spring 2016 - 3
IEEE Solid-State Circuits Magazine - Spring 2016 - 4
IEEE Solid-State Circuits Magazine - Spring 2016 - 5
IEEE Solid-State Circuits Magazine - Spring 2016 - 6
IEEE Solid-State Circuits Magazine - Spring 2016 - 7
IEEE Solid-State Circuits Magazine - Spring 2016 - 8
IEEE Solid-State Circuits Magazine - Spring 2016 - 9
IEEE Solid-State Circuits Magazine - Spring 2016 - 10
IEEE Solid-State Circuits Magazine - Spring 2016 - 11
IEEE Solid-State Circuits Magazine - Spring 2016 - 12
IEEE Solid-State Circuits Magazine - Spring 2016 - 13
IEEE Solid-State Circuits Magazine - Spring 2016 - 14
IEEE Solid-State Circuits Magazine - Spring 2016 - 15
IEEE Solid-State Circuits Magazine - Spring 2016 - 16
IEEE Solid-State Circuits Magazine - Spring 2016 - 17
IEEE Solid-State Circuits Magazine - Spring 2016 - 18
IEEE Solid-State Circuits Magazine - Spring 2016 - 19
IEEE Solid-State Circuits Magazine - Spring 2016 - 20
IEEE Solid-State Circuits Magazine - Spring 2016 - 21
IEEE Solid-State Circuits Magazine - Spring 2016 - 22
IEEE Solid-State Circuits Magazine - Spring 2016 - 23
IEEE Solid-State Circuits Magazine - Spring 2016 - 24
IEEE Solid-State Circuits Magazine - Spring 2016 - 25
IEEE Solid-State Circuits Magazine - Spring 2016 - 26
IEEE Solid-State Circuits Magazine - Spring 2016 - 27
IEEE Solid-State Circuits Magazine - Spring 2016 - 28
IEEE Solid-State Circuits Magazine - Spring 2016 - 29
IEEE Solid-State Circuits Magazine - Spring 2016 - 30
IEEE Solid-State Circuits Magazine - Spring 2016 - 31
IEEE Solid-State Circuits Magazine - Spring 2016 - 32
IEEE Solid-State Circuits Magazine - Spring 2016 - 33
IEEE Solid-State Circuits Magazine - Spring 2016 - 34
IEEE Solid-State Circuits Magazine - Spring 2016 - 35
IEEE Solid-State Circuits Magazine - Spring 2016 - 36
IEEE Solid-State Circuits Magazine - Spring 2016 - 37
IEEE Solid-State Circuits Magazine - Spring 2016 - 38
IEEE Solid-State Circuits Magazine - Spring 2016 - 39
IEEE Solid-State Circuits Magazine - Spring 2016 - 40
IEEE Solid-State Circuits Magazine - Spring 2016 - 41
IEEE Solid-State Circuits Magazine - Spring 2016 - 42
IEEE Solid-State Circuits Magazine - Spring 2016 - 43
IEEE Solid-State Circuits Magazine - Spring 2016 - 44
IEEE Solid-State Circuits Magazine - Spring 2016 - 45
IEEE Solid-State Circuits Magazine - Spring 2016 - 46
IEEE Solid-State Circuits Magazine - Spring 2016 - 47
IEEE Solid-State Circuits Magazine - Spring 2016 - 48
IEEE Solid-State Circuits Magazine - Spring 2016 - 49
IEEE Solid-State Circuits Magazine - Spring 2016 - 50
IEEE Solid-State Circuits Magazine - Spring 2016 - 51
IEEE Solid-State Circuits Magazine - Spring 2016 - 52
IEEE Solid-State Circuits Magazine - Spring 2016 - 53
IEEE Solid-State Circuits Magazine - Spring 2016 - 54
IEEE Solid-State Circuits Magazine - Spring 2016 - 55
IEEE Solid-State Circuits Magazine - Spring 2016 - 56
IEEE Solid-State Circuits Magazine - Spring 2016 - 57
IEEE Solid-State Circuits Magazine - Spring 2016 - 58
IEEE Solid-State Circuits Magazine - Spring 2016 - 59
IEEE Solid-State Circuits Magazine - Spring 2016 - 60
IEEE Solid-State Circuits Magazine - Spring 2016 - 61
IEEE Solid-State Circuits Magazine - Spring 2016 - 62
IEEE Solid-State Circuits Magazine - Spring 2016 - 63
IEEE Solid-State Circuits Magazine - Spring 2016 - 64
IEEE Solid-State Circuits Magazine - Spring 2016 - 65
IEEE Solid-State Circuits Magazine - Spring 2016 - 66
IEEE Solid-State Circuits Magazine - Spring 2016 - 67
IEEE Solid-State Circuits Magazine - Spring 2016 - 68
IEEE Solid-State Circuits Magazine - Spring 2016 - 69
IEEE Solid-State Circuits Magazine - Spring 2016 - 70
IEEE Solid-State Circuits Magazine - Spring 2016 - 71
IEEE Solid-State Circuits Magazine - Spring 2016 - 72
IEEE Solid-State Circuits Magazine - Spring 2016 - 73
IEEE Solid-State Circuits Magazine - Spring 2016 - 74
IEEE Solid-State Circuits Magazine - Spring 2016 - 75
IEEE Solid-State Circuits Magazine - Spring 2016 - 76
IEEE Solid-State Circuits Magazine - Spring 2016 - 77
IEEE Solid-State Circuits Magazine - Spring 2016 - 78
IEEE Solid-State Circuits Magazine - Spring 2016 - 79
IEEE Solid-State Circuits Magazine - Spring 2016 - 80
IEEE Solid-State Circuits Magazine - Spring 2016 - 81
IEEE Solid-State Circuits Magazine - Spring 2016 - 82
IEEE Solid-State Circuits Magazine - Spring 2016 - 83
IEEE Solid-State Circuits Magazine - Spring 2016 - 84
IEEE Solid-State Circuits Magazine - Spring 2016 - 85
IEEE Solid-State Circuits Magazine - Spring 2016 - 86
IEEE Solid-State Circuits Magazine - Spring 2016 - 87
IEEE Solid-State Circuits Magazine - Spring 2016 - 88
IEEE Solid-State Circuits Magazine - Spring 2016 - 89
IEEE Solid-State Circuits Magazine - Spring 2016 - 90
IEEE Solid-State Circuits Magazine - Spring 2016 - 91
IEEE Solid-State Circuits Magazine - Spring 2016 - 92
IEEE Solid-State Circuits Magazine - Spring 2016 - 93
IEEE Solid-State Circuits Magazine - Spring 2016 - 94
IEEE Solid-State Circuits Magazine - Spring 2016 - 95
IEEE Solid-State Circuits Magazine - Spring 2016 - 96
IEEE Solid-State Circuits Magazine - Spring 2016 - 97
IEEE Solid-State Circuits Magazine - Spring 2016 - 98
IEEE Solid-State Circuits Magazine - Spring 2016 - 99
IEEE Solid-State Circuits Magazine - Spring 2016 - 100
IEEE Solid-State Circuits Magazine - Spring 2016 - 101
IEEE Solid-State Circuits Magazine - Spring 2016 - 102
IEEE Solid-State Circuits Magazine - Spring 2016 - 103
IEEE Solid-State Circuits Magazine - Spring 2016 - 104
IEEE Solid-State Circuits Magazine - Spring 2016 - 105
IEEE Solid-State Circuits Magazine - Spring 2016 - 106
IEEE Solid-State Circuits Magazine - Spring 2016 - 107
IEEE Solid-State Circuits Magazine - Spring 2016 - 108
IEEE Solid-State Circuits Magazine - Spring 2016 - 109
IEEE Solid-State Circuits Magazine - Spring 2016 - 110
IEEE Solid-State Circuits Magazine - Spring 2016 - 111
IEEE Solid-State Circuits Magazine - Spring 2016 - 112
IEEE Solid-State Circuits Magazine - Spring 2016 - 113
IEEE Solid-State Circuits Magazine - Spring 2016 - 114
IEEE Solid-State Circuits Magazine - Spring 2016 - 115
IEEE Solid-State Circuits Magazine - Spring 2016 - 116
IEEE Solid-State Circuits Magazine - Spring 2016 - 117
IEEE Solid-State Circuits Magazine - Spring 2016 - 118
IEEE Solid-State Circuits Magazine - Spring 2016 - 119
IEEE Solid-State Circuits Magazine - Spring 2016 - 120
IEEE Solid-State Circuits Magazine - Spring 2016 - 121
IEEE Solid-State Circuits Magazine - Spring 2016 - 122
IEEE Solid-State Circuits Magazine - Spring 2016 - 123
IEEE Solid-State Circuits Magazine - Spring 2016 - 124
IEEE Solid-State Circuits Magazine - Spring 2016 - Cover3
IEEE Solid-State Circuits Magazine - Spring 2016 - Cover4
https://www.nxtbook.com/nxtbooks/ieee/mssc_fall2023
https://www.nxtbook.com/nxtbooks/ieee/mssc_summer2023
https://www.nxtbook.com/nxtbooks/ieee/mssc_spring2023
https://www.nxtbook.com/nxtbooks/ieee/mssc_winter2023
https://www.nxtbook.com/nxtbooks/ieee/mssc_fall2022
https://www.nxtbook.com/nxtbooks/ieee/mssc_summer2022
https://www.nxtbook.com/nxtbooks/ieee/mssc_spring2022
https://www.nxtbook.com/nxtbooks/ieee/mssc_winter2022
https://www.nxtbook.com/nxtbooks/ieee/mssc_fall2021
https://www.nxtbook.com/nxtbooks/ieee/mssc_summer2021
https://www.nxtbook.com/nxtbooks/ieee/mssc_spring2021
https://www.nxtbook.com/nxtbooks/ieee/mssc_winter2021
https://www.nxtbook.com/nxtbooks/ieee/mssc_fall2020
https://www.nxtbook.com/nxtbooks/ieee/mssc_summer2020
https://www.nxtbook.com/nxtbooks/ieee/mssc_spring2020
https://www.nxtbook.com/nxtbooks/ieee/mssc_winter2020
https://www.nxtbook.com/nxtbooks/ieee/mssc_fall2019
https://www.nxtbook.com/nxtbooks/ieee/mssc_summer2019
https://www.nxtbook.com/nxtbooks/ieee/mssc_2019summer
https://www.nxtbook.com/nxtbooks/ieee/mssc_2019winter
https://www.nxtbook.com/nxtbooks/ieee/mssc_2018fall
https://www.nxtbook.com/nxtbooks/ieee/mssc_2018summer
https://www.nxtbook.com/nxtbooks/ieee/mssc_2018spring
https://www.nxtbook.com/nxtbooks/ieee/mssc_2018winter
https://www.nxtbook.com/nxtbooks/ieee/solidstatecircuits_winter2017
https://www.nxtbook.com/nxtbooks/ieee/solidstatecircuits_fall2017
https://www.nxtbook.com/nxtbooks/ieee/solidstatecircuits_summer2017
https://www.nxtbook.com/nxtbooks/ieee/solidstatecircuits_spring2017
https://www.nxtbook.com/nxtbooks/ieee/solidstatecircuits_winter2016
https://www.nxtbook.com/nxtbooks/ieee/solidstatecircuits_fall2016
https://www.nxtbook.com/nxtbooks/ieee/solidstatecircuits_summer2016
https://www.nxtbook.com/nxtbooks/ieee/solidstatecircuits_spring2016
https://www.nxtbook.com/nxtbooks/ieee/solidstatecircuits_winter2015
https://www.nxtbook.com/nxtbooks/ieee/solidstatecircuits_fall2015
https://www.nxtbook.com/nxtbooks/ieee/solidstatecircuits_summer2015
https://www.nxtbook.com/nxtbooks/ieee/solidstatecircuits_spring2015
https://www.nxtbook.com/nxtbooks/ieee/solidstatecircuits_winter2014
https://www.nxtbook.com/nxtbooks/ieee/solidstatecircuits_fall2014
https://www.nxtbook.com/nxtbooks/ieee/solidstatecircuits_summer2014
https://www.nxtbook.com/nxtbooks/ieee/solidstatecircuits_spring2014
https://www.nxtbookmedia.com