IEEE Solid-State Circuits Magazine - Winter 2016 - 67

chap ters

SSCS DL Albert Theuwissen Visits Beijing Chapter

I

IEEE Solid-State Circuits Society (SSCS)
Distinguished Lecturer (DL) Albert
Theuwissen, a professor at Delft
University of Technology, visited the
SSCS Beijing Chapter on 6 September
2015 to give a lecture on CMOS image
sensors. The lecture was held at the
Chinese Academy of Sciences and
attracted both faculty members and
students from local universities and
research institutes.
China's CMOS image-sensor companies are rapidly developing. Local
universities and research institutes in
Beijing are constantly doing groundbreaking research. Prof. Theuwissen's talk was very well received and
gave local researchers, faculty, and
students the opportunity to discuss
the research being done with a pioneering researcher.

prof. theuwissen talked about the deep trench isolation technique.

Abstract
This talk deals with the major new
developments for CMOS image sensors. As a guide through the wide
variety of new technologies and developments, the International Image
Sensor Workshop 2015 is being used.
More information about (ultra-)low
noise devices, large area sensors,
stacked imagers, and sensors with
extremely large conversion gains will
be revealed. In the last part of the presentation, the future of imagers will be
discussed. Special focus will be given
to the question: What else can be done
with those CMOS pixels besides capturing imaging information?

prof. theuwissen talked about the technical trend of cMOs image sensors.

-Abira Sengupta
Digital Object Identifier 10.1109/MSSC.2015.2495879
Date of publication: 21 January 2016

after the talk, prof. Nanjian Wu (right) from the Institute of semiconductors, chinese academy of sciences, thanked prof. albert theuwissen (left) for his impressive presentation and
gave him a traditional chinese gift.

IEEE SOLID-STATE CIRCUITS MAGAZINE

W I N T E R 2 0 16

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