Electronics Protection - July/August 2013 - (Page 6)
Feature
Formable Phase Change Materials as Latent Heat Sinks for
Portable Electronic Devices
Jackson Sutherland, Chemist
Outlast Technologies LLC
Powerful Devices and Overheated Consumers
Advances in computing technology have led to electronic devices
that can achieve extraordinary processing feats in the smallest and
slimmest of devices. While most consumers have grown accustomed
to having such power in the palms of their hands, they have also
unfortunately grown accustomed to the unpleasant heat produced
from such compact and intensive electronic devices. In addition to increased touch and surface temperatures, elevated internal hardware
temperature can lead to device performance degradation from heatrelated stress or firmware related decreases in CPU processing speed.
To maintain the sleek designs of current devices, active cooling such
as fans or liquid circulation cannot be implemented due to space
restrictions. This device miniaturization inherently drives the required
heat dissipation into even smaller volumes. This leaves a ready, and
unfilled, market for passive thermal control heat-sinks and like products to deal with thermal relief in space-limited electronic devices.
How Latent Heat Sink Phase-Change Materials Work
One such method for passive cooling is realized through the incorporation of phase change materials (PCMs) into various matrices.
A PCM is any material that has a high enthalpy of fusion (usually
reported in Joules/gram, J/g), also known as the latent heat of the
material. The latent heat of a material is the amount of energy
required for a unit mass of material to undergo a phase change. Note
that during a phase change, the temperature of the material remains
constant. An explanation of this phenomenon can be given through
basic kinetic theory.
According to kinetic theory, the average kinetic energy is equal to
the absolute temperature. So, by adding heat energy to the system,
we are able to increase the kinetic energy and thus the temperature.
However, a substance in a given phase can only reach a certain kinetic
energy because it is bound by intermolecular forces of neighboring
molecules. With enough energy, these intermolecular forces are overcome and a phase change occurs. After each phase change, additional
degrees of freedom are added to the molecule, allowing for increased
kinetic energy, and thus allowing the temperature to once again rise.
As an example, consider the most familiar PCM, H2O. In its solid
form, ice, the strong intermolecular interactions of the crystal lattice
limit the molecules to vibrational motion only. As energy is added to
the system, the molecules within the lattice will vibrate with more
and more intensity, relating to an increase in temperature, but they
will reach a maximum vibrational energy at 0°C. At this temperature,
energy that is introduced to the system is used to overcome the
intermolecular forces of the crystal lattice, releasing molecules into
their liquid state. Once in the liquid state, the H2O molecules are
then able to not only vibrate, but also rotate. The temperature can
once again increase with an input of energy. This process will occur
again for the vaporization process at 100°C when the molecules gain
translational motion.
Phase Change Material Formulation for Electronics
The Outlast LHS-89, the PCM used in this study, contains a proprietary blend of PCM that melts and absorbs energy between the
ranges of 36°C and 42°C. These temperature ranges are significant
to control both touch/surface temperatures, and internal processing
temperatures. Physiologically, buffering this temperature range is of
significance because in the average person, heat-associated pain is
6
signaled to the central nervous system at 43°C. Some heat related
discomfort does still occur at lower temperatures, giving reason to
begin buffering temperatures at those lower than 43°C.
In an attempt to control extreme temperatures at the device
surface, the firmware of most current devices will step down the
processing speed of the CPU to limit heat generation once a given
internal temperature is reached. Consequentially, this gives need for
the material to be able to buffer temperature within the device as
well. Through differential scanning calorimetry, the Outlast LHS-89
PCM composite was measured to have 160 J/g of latent heat. This
translates to over 1.1 kilojoule of energy buffering capacity with the
use of just over 7 grams of product.
There are certain considerations intrinsic to the application, which
had to be accounted for in the formulation of LHS-89. Chemical
compatibility is of utmost importance when adding material to any
electronic device. For this reason, the Outlast LHS-89 contains no inorganic components, is pH neutral, inert and incorporates no readilyreactive moieties. The thermal stability of the product was rigorously
tested through thousands of heating and cooling cycles to assure no
loss of energy absorption or temperature buffering performance of
the LHS-89 over time. The LHS-89 does not run, leak or outgas, and
adheres to UL-94 flame retardant requirements for electronic devices.
Application Testing
A Samsung Galaxy S3 with 1.5 GHz
dual core Qualcomm Krait CPUs, Qualcomm Adreno 225 GPU and a Qualcomm
Snapdragon S4 MSM8960 SoC was tested
as purchased and with the LHS-89 placed
beneath the EMI shield of the device (Figure 1). Before all tests were performed,
the device was allowed to equilibrate at
28°C for one hour.
To test the efficacy of the LHS-89 at internally cooling the device and delaying a
temperature-related decrease in process- Figure 1. Outlast LHS-89 in
place underneath the EMI
ing speed due to firmware throttling, the
internal CPU temperatures were recorded shield of the test device.
while a Dhrystone test was continuously
run on both processors. During this test both processor units clocked
at 1.5 GHz until the firmware throttled down the CPU speed due to
overheating at a CPU temperature of 57°C. A continuous Dhrystone
benchmark was selected since it is an extremely CPU-intensive task
and has good repeatability throughout tests (Figure 2). The LHS89 was able to absorb enough heat to allow both CPUs to run at
maximum processing speed for 4.73 minutes, compared to the 1.99
minutes without Outlast LHS-89. This corresponds to a 137 percent
increase in time at maximum processing speed.
In a second test, the ability of Outlast LHS-89 to decrease exterior
touch temperature was assessed. A benchmark test (Open GL 2.5.1
Egypt) was continuously run while the external hot spot temperature
of the device with and without Outlast LHS-89 was recorded through
IR thermography at regular time intervals (Figure 3). A reduction
in hot spot temperature of at least 4°C was achieved from the time
interval of two to 20 minutes. This reduction in hot spot temperature
resulted in the device with Outlast LHS-89 remaining below the 43°C
threshold associated with temperature related pain for 2.5 times as
long as the device without Outlast LHS-89 (six minutes compared to
15 minutes). Figure 3 gives thermal images of the device with and
without Outlast LHS-89 at selected time intervals while running the
Open GL 2.5.1 Egypt looped gaming benchmark.
July/August 2013
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Table of Contents for the Digital Edition of Electronics Protection - July/August 2013
Electronics Protection - July/August 2013
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